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The applicability of the structure-factor phase method in determining the polarity of binary semiconductors is investigated by dynamical simulations of convergent-beam electron diffraction. It was found that this method is efficient to determine the polarity of a sphalerite structure under certain conditions, and, reversely, limited to determine the polarity of a wurtzite structure.

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Twelve orientation domain variants in vacancy-ordered titanium monoxide TiOx and the crystallographic relationships among them were analyzed systematically by combining the group theory analysis and the electron diffraction technique.
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