Wavelength-dispersive double flat-crystal analyzer for inelastic X-ray scattering

G. Bortel, E. E. Alp, W. Sturhahn and T. S. Toellner

A wavelength-dispersive double flat-crystal analyzer for inelastic X-ray scattering is described. Experimental characterization of this new X-ray optic and comparison with a spherical-focusing backscattering analyzer are presented.

Keywords: X-ray optics; crystal analyzers; resonant/anomalous inelastic X-ray scattering; absorption edges; electronic and vibrational excitations; parallel data collection.

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