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Interference fringes are measured from the lateral surface of a plane-parallel Si crystal by changing the distance between the incident point of the X-rays and the crystal edge. The measured fringes are well reproduced by a calculation based on the dynamical theory of diffraction with the visibility taken into account and are attributed to interference fringes between the beams in two different multiple Bragg-Laue modes.

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Acta Cryst. (2011). A67, C441-C442
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