Acta Crystallographica Section A
Acta Crystallographica
Section A
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Acta Cryst.
(2008).
A
64
,
587-597
https://doi.org/10.1107/S0108767308021338
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Determination of the electrostatic potential and electron density of silicon using convergent-beam electron diffraction
Y. Ogata
,
K. Tsuda
and
M. Tanaka
A structure-analysis method using convergent-beam electron diffraction has been applied to the determination of the electrostatic potential and electron density of crystalline silicon.
Keywords:
convergent-beam electron diffraction (CBED)
;
electrostatic potential
;
electron density
;
silicon
.
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