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Six-beam pinhole topographs of a floating-zone silicon crystal were experimentally obtained with the incidence of synchrotron X-rays whose polarization state was controlled using an X-ray phase-retarder system which can generate an arbitrary state of polarization. The topographs agreed quantitatively with computer-simulated images based on an n-beam Takagi-Taupin equation for which the derivation procedure is described in detail.
