Journal of Applied Crystallography
Journal of Applied
Crystallography
IUCr
IT
WDC
search IUCr Journals
home
archive
editors
for authors
for readers
submit
subscribe
open access
journal menu
home
archive
editors
for authors
for readers
submit
subscribe
open access
research papers
Share
Share
Issue contents
Article statistics
Download citation
Format
BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Download PDF of article
J. Appl. Cryst.
(2012).
45
,
507-512
https://doi.org/10.1107/S0021889812008928
Download PDF of article
Download citation
Format
BIBTeX
EndNote
RefMan
Refer
Medline
CIF
SGML
Text
Plain Text
Article statistics
Issue contents
Share
Optimization of the thickness of a ZnS/
6
LiF scintillator for a high-resolution detector installed on a focusing small-angle neutron scattering spectrometer (SANS-U)
H. Iwase
,
M. Katagiri
and
M. Shibayama
The high-resolution detector on the SANS-U spectrometer at the Japan Atomic Energy Agency has been upgraded by improving experimental efficiency with the optimization of the thickness of a ZnS/
6
LiF scintillator.
Keywords:
scintillator
;
focusing small-angle neutron scattering
;
high-resolution detectors
;
detection efficiency
.
Read article
Similar articles
Follow J. Appl. Cryst.
E-alerts
Twitter
Facebook
RSS