Microbeam X-ray diffraction from twisted lamellar crystals: theory and computer simulation

Theoretical and computer simulation approaches are developed for modelling the microbeam X-ray diffraction patterns from twisted lamellar ribbons. The angular broadening of diffraction peaks is accounted for by the varying crystal orientation caused by lamellar twisting. The proposed peak broadening analysis can be used, for example, in morphological studies of banded polymer spherulites.