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A novel method for focusing X-rays in two dimensions by thermal-gradient crystals in symmetrical Laue geometry is described. The intensity in the focal point can be increased significantly by using thermal-gradient crystals.

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A focusing Laue diffractometer is presented for high-energy X-rays of up to 300 keV in a laboratory environment. The long attenuation length for high-energy X-rays allows for the non-destructive investigation of structural issues and bulk properties of single crystals.
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