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The increased interest in recent years regarding the properties and applications of nanomaterials has also created the need to characterize the structures of these materials. However, due to the lack of long-range atomic ordering, the structures of nanostructured and amorphous materials are not accessible by conventional diffraction methods used to study crystalline materials. One of the most promising techniques to study nanostructures using X-ray diffraction is by using the total scattering (Bragg peaks and diffuse scattering) from the samples and the pair distribution function (PDF) analysis. The pair distribution function provides the probability of finding atoms separated by a certain distance. This function is not direction-dependent; it only looks at the absolute value of the distance between the nearest neighbors, the next nearest neighbors and so on. The method can therefore also be used to analyze non-crystalline materials. From experimental point of view a typical PDF analysis requires the use of intense high-energy X-ray radiation (E ≥ 20 KeV) and a wide 2θ range. After the initial feasibility studies regarding the use of standard laboratory diffraction equipment for PDF analysis [1-3] this application has been further developed to achieve improved data quality and to extend the range of materials, environmental conditions and geometrical configurations that can be used for PDF experiments. Studies performed on different nanocrystalline and amorphous materials of scientific and technological interest, including organic substances, oxides, metallic alloys, etc. have demonstrated that PDF analysis with a laboratory diffractometer can be a valuable tool for structural characterization of nanomaterials. This contribution presents several examples of laboratory PDF studies, in which the experimental conditions have been successfully adapted to match the specific requirements of materials under investigation.
abstracts
With the increasing number of GISAXS (Grazing-Incidence Small-Angle X-ray Scattering) applications for the investigation of materials surface nano-structures, comes the demand for a mainstream laboratory capability to run alongside the more established synchrotron facilities. GISAXS poses considerable challenges when scaling the method to fit a multipurpose laboratory instrument, including the achievement of good angular resolution at small scattering radius, the reduction of scatter from the direct beam and the observation of low intensity signals. We have developed a hardware solution that addresses these challenges. The recent availability of small size pixel (55 micron) photon counting detectors with very low noise characteristics has enabled the implementation of new 2D imaging GISAXS hardware for a standard 1.8KW laboratory X-ray source. In this work we present a number of results that illustrate the capabilities of the new experimental set-up based on a standard multipurpose diffractometer. We present GISAXS images and analysis of a mesoporous silica thin film with close-packed hexagonal type ordering of the pores. In [1] we have reported reflectometry results and analysis of this sample structure. The addition of GISAXS information demonstrates the versatility of the multipurpose diffractometer and the strength in combining methods on one instrument. Strongly scattering Ti-filled silica mesoporous films illustrate the relative ease with which GISAXS signals can be recorded, including even the weak signal below the critical angle of the sample (fig.1). The scattering patterns from both samples exhibit subtle departures from a simple symmetry, suggesting that the films may exhibit residual strain. Thin films with vertical mesopores provide their own challenges in the observation of scatter close and parallel to the specularly reflected beam. We present results in which scattering from Co-filled mesopore structures with 37nm pitch can be clearly resolved.
