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Acta Cryst. (2014). A70, C105
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We introduce a novel method for reconstructing nuclear density distributions (NDDs): Nuclear Enhanced X-ray Maximum Entropy Method (NEXMEM). NEXMEM offers an alternative route to experimental NDDs, exploiting the superior quality of synchrotron X-ray data compared to neutron data. The method was conceived to analyse local distortions in the thermoelectric lead chalcogenides, PbX (X = S, Se, Te). Thermoelectric materials are functional materials with the unique ability to interconvert heat and electricity, holding much promise for green energy solutions such as waste heat recovery. The extraordinary thermoelectric performance of binary lead chalcogenides has caused huge research activity, but the mechanisms governing their unexpected low thermal conductivity still remain a controversial topic. It has been proposed to result from giant anharmonic phonon scattering or from local fluctuating dipoles on the Pb site.[1,2] No macroscopic symmetry change are associated with these effects, rendering them invisible to conventional crystallographic techniques. For this reason PbX was until recently believed to adopt the ideal, undistorted rock-salt structure. In the present study, we investigate PbX using multi-temperature synchrotron powder X-ray diffraction data in combination with the maximum entropy method (MEM) and NEXMEM. In addition NEXMEM has been validated by testing against simulated powder diffraction data of PbTe with known displacements of Pb. The increased resolution of NEXMEM proved essential for resolving Pb-displacement of 0.2 Å in simulated data. The figure below shows Pb in the (100) plane for MEM, NEXMEM and the actual NDD of the test structure. Our findings outline the extent of disorder in lead chalcogenides, promoting our understanding of this class of high-performance thermoelectric materials. Furthermore we introduce NEXMEM which can be used for widespread characterization of subtle atomic features in crystals with unusual properties.

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Acta Cryst. (2014). A70, C1341
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Advancements within the field of synchrotron powder X-ray diffraction (SPXRD) have rendered it a viable approach for probing subtle electronic features. It is especially powerful for highly crystalline inorganic extended materials, resolving severe extinction issues conventionally encountered with single-crystal diffraction. Furthermore, SPXRD data exhibit markedly reduced absorption and may be collected in a single exposure. The latter prevents systematic errors from merging a multitude of detector frames, each possessing a slightly different scale factor. These experimental advantages are counterbalanced by a more complicated data analysis, where the key problems are the inherent challenges of overlapping reflections and background subtraction. To evaluate the performance of SPXRD and to test the methodologies for estimating charge densities (CDs), we use benchmark data on diamond collected to low d-spacing. [1] The critical step is the recovery of observed structure factors from the powder pattern. This is the focal point of the present study, scrutinizing several traditional and novel approaches that deviate strongly in terms of model complexity and structure-dependency. All recovered sets of structure factors are evaluated with respect to their capability to determine the true atomic displacement parameter and to estimate the CD by both multipolar modelling and maximum entropy reconstruction. The data are of such exceptional quality that they even reveal how the innermost electron density responds to the formation of covalent bonding (figure below). Supporting their huge success over the last decades, only the Rietveld-based approaches are capable of quantifying this fine feature. The study of core polarization has emerged as a new frontier in chemical bonding studies, and the relevant experimental information may be reliably accessed by SPRXD for highly crystalline materials.
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