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Acta Cryst A. (2013). A69, s138
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Computer control of beam tilt and image capture allows the collection of electron diffraction patterns over a large angular range, without any overlap in diffraction data and from a region limited only by the size of the electron beam. This results in a significant improvement in data volumes and ease of interpretation.

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Acta Cryst A. (2013). A69, s439
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