Imaging a sub-ångstrøm electron beam after scattering in a crystal

Atomic-scale structure of plate-shaped precipitates in Al-Cu-based alloys

Atomic resolution imaging using the real-space distribution of electrons scattered by a crystalline material

An atomic resolution incoherent imaging mode in scanning transmission electron microscopy using detectors in real space, achieving a resolution comparable to conventional HAADF-STEM with good contrast, is presented. Simulations based on a newly proposed imaging mechanism shows excellent qualitative agreement with the experiments.