Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Vacuum-ultraviolet circular dichroism of amino acid films by polarizing undulator-based system

M. Tanaka, K. Yagi-Watanabe, F. Kaneko and K. Nakagawa

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Observation of aminyl radical during photo-induced Orton rearrangement in single-crystalline state

P. Naumov, K. Sakurai, M. Tanaka and H. Hara

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X-ray diffraction study on quartz surface on α–β phase transition

T. Kumagai, M. Tanaka, H. Tajiri, O. Sakata, H. Terauchi and I. Takahashi

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Determination of the electrostatic potential and electron density of silicon using convergent-beam electron diffraction

Y. Ogata, K. Tsuda and M. Tanaka

A structure-analysis method using convergent-beam electron diffraction has been applied to the determination of the electrostatic potential and electron density of crystalline silicon.

Keywords: convergent-beam electron diffraction (CBED); electrostatic potential; electron density; silicon.

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Electrostatic potential analysis of the ferroelectric phases of perovskite oxides using CBED

K. Tsuda and M. Tanaka

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