Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
The influence of the instrumental resolution on two-dimensional reflection profiles of epitaxic YBa2Cu3O7−δ films on SrTiO3 (001) has been studied in order to investigate the strain in the superconducting films. The X-ray diffraction intensity data were obtained by two-dimensional scans in reciprocal space (q-scan). Since the reflection broadening caused by the apparatus differs for each position in reciprocal space, a highly crystalline substrate was used as a standard. Thus it was possible to measure a standard very close to the YBa2Cu3O7−δ reflections in reciprocal space. The two-dimensional deconvolution of reflections by a new computer program revealed an anisotropic strain of the two twinning systems of the film.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
   HTML (US $40)
   PDF+HTML (US $50)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds