research papers
In recent work, the scattering-vector method was shown to be well suited for the detection of residual stress fields, which vary significantly within the penetration depth τ of the X-rays. It allows the separate evaluation of individual components σij(τ) of the stress tensor directly from a series of measured φψ(hkl, τ) depth profiles, which are obtained after stepwise rotation of the sample around the scattering vector gφψ for fixed angle sets (φ, ψ). In this paper, a solution of improved stability for deriving the Laplace stress profiles σij(τ) is presented. It is based on the extreme sensitivity of the individual φψ(hkl, τ) profiles with respect to the strain-free lattice spacing d0(hkl), which can be used as a criterion for a simultaneous determination of d0(hkl) itself as well as of optimized σij(τ) profiles.