Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(1996).
29
,
568-573
https://doi.org/10.1107/S0021889896006401
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X-ray Moiré Topography on SIMOX Structures
M. Ohler
,
E. Prieur
and
J. Härtwig
From Moiré fringes observed on X-ray diffraction topographs of SIMOX (separation by implantation of oxygen) structures, the in-plane components of the triclinic relative strain are determined.
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