Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations

A method is presented for the calculation of diffraction line profiles using Monte Carlo simulation. The method is used to calculate diffraction line profiles for specimens with some idealized distributions of dislocations. The results have been compared with analytical expressions available for these special dislocation distributions. This comparison has been used to validate some essential assumptions made in the derivation of the analytical expressions. In general, very good agreement has been found. Thus, the proposed method is shown to be a valuable tool for diffraction line profile analysis.