An improved goniometer head for high-temperature single-crystal X-ray diffraction

A reliable and inexpensive goniometer head has been designed. Its stability, resulting from its compact construction, makes it very suitable for accurate measurements. Moreover, its space-saving design facilitates its application in X-ray data collection using charge-coupled device (CCD) detectors. This head has been improved for high-temperature measurements and has been tested by comparison of accurate K_0.88Rb_0.12TiOPO₄ data collected both at room temperature and at 973 K on the same crystal. The excellent structure results obtained at 973 K during the 360 h of measurements prove the stability of the goniometer head.