The structure of the title compound consists of distorted B
12 icosahedra linked by N-B-N chains. The compound crystallizes in the rhombohedral space group
Rm (No. 166). The unit cell contains four symmetry-independent atom sites, three of which are occupied by boron [in the 18
h, 18
h (site symmetry
m) and 3
b (site symmetry
m) Wyckoff positions] and one by nitrogen (in the 6
c Wyckoff position, site symmetry 3
m). Two of the B atoms form the icosahedra, while N atoms link the icosahedra together. The main feature of the structure is that the 3
b position is occupied by the B atom, which makes the structure different from those of B
6O, for which these atom sites are vacant, and B
4+xC
1-x, for which this position is randomly occupied by both B and C atoms.
Supporting information
Boron subnitride, B13N2, was synthesized from the B–BN melt at 5 GPa using
the multianvil X-ray system MAX80 at beamline F2.1, HASYLAB-DESY. The
experimental setup has been described elsewhere (Solozhenko & Peun, 1997). The
starting materials, β -rhombohedral boron (β -rh B) and hexagonal boron
nitride (hBN), were mixed in the 5:1 molar ratio that corresponds to the B6N
stoichiometry, compressed to 5 GPa, heated to 2500 K and then quenched down to
ambient conditions. Since the B13N2 phase crystallizes by peritectic
reaction, the title compound has always been found in a mixture with β-rh
boron, an I-tetragonal boron-like phase (Ploog et al., 1972) and hBN.
According to Rietveld refinement, the sample contains about 22 vol% of
B13N2.
Rietveld analysis of the powder diffraction pattern that contains six phases
(five with already established structures and one new) made for a complicated
refinement. The 2θ interval for the profile fitting (Fig. 1) was chosen so
that the main lines of boron subnitride B13N2 have not been overlapped by
the lines of other phases. The profile fitting of all the phases except
B13N2 was performed employing both LeBail and Rietveld procedures using
the literature data on the structures of corresponding phases.
Six phases were employed for profile fitting: B13N2 (phase 1), `B50N2'
(phase 2), hBN (phase 3), β-rhombohedral boron (phase 4), boric acid
H3BO3 (phase 5) and phase 6, which has the same structure as phase 3 but
slightly different cell parameter c. Phase 6 was added to adjust the
profile asymmetry of the 002 line due to a slight nonhomogeneity in the degree
of ordering of hBN (Franklin, 1950, 1951). This has improved the fitting of
the most intensive line of hBN (24–26° 2θ) and has not influenced fitting
out of this range. The only line of phase 5 belongs to this 2θ range and does
not affect the structure refinement of the principal phase. Phases 2 and 4
have some lines overlapping with the lines of B13N2, but these lines are
noticeably narrower than those of phase 1; this difference has much
facilitated the intensity extraction.
The sample contains approximately 22 vol% B13N2, 37 vol% hBN and about 41
vol% boron. The boron content (both β-rhombohedral boron and I-t boron-like
phase) was estimated using the values of phase fractions for B13N2 and hBN
and the total composition of the starting mixture (5B+BN). A very small amount
of boric acid (0.001 vol%) was also observed. Its formation may be attributed
to hBN hydrolysis that cannot be avoided in the high-pressure experiments.
Data collection: program (reference)? for phase_4. Cell refinement: program (reference)? for phase_4. Data reduction: program (reference)? for phase_4. Program(s) used to solve structure: program (reference)? for phase_4. Program(s) used to refine structure: GSAS for phase_4. Molecular graphics: program (reference)? for phase_4. Software used to prepare material for publication: program (reference)? for phase_4.
(phase_1) boron nitride
top
Crystal data top
B13N2 | Z = 3 |
Mr = 168.54 | F(000) = 235 |
Trigonal, R3m | Dx = 2.666 Mg m−3 |
Hall symbol: -R 3 2" | Cu Kα radiation, λ = 1.540598 Å |
a = 5.4455 (2) Å | T = 297 K |
c = 12.2649 (9) Å | black |
V = 314.97 (4) Å3 | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Specimen mounting: Si syngle crystal (111) |
Radiation source: copper x-ray tube, CuKα | Data collection mode: reflection |
Yes monochromator | Scan method: Stationary detector |
Refinement top
Least-squares matrix: full | Excluded region(s): unavoidable non-uniform strain render impossible to adjust
the profile function parameters in a wide angle range. |
Rp = 0.100 | Profile function: CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = 95.838 #3(GW) = 7.893
#4(LX) = 1.057 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -0.9606 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 8.000
#4(LX) = 5.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = 20.000 #3(GW) = 30.000
#4(LX) = 0.000 #5(LY) = 0.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = -5.000 #3(GW) = 12.000
#4(LX) = 2.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -1.7500 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0050 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 786.199
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -5.000 #3(GW) = 591.058
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0 |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | Background function: GSAS Background function number 2 with 2 terms.
Cosine Fourier series
1: 305.650 2: 196.641 |
5000 data points | Preferred orientation correction: March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.65811 h= 1.000 k= 0.000 l= 0.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000 |
Crystal data top
B13N2 | V = 314.97 (4) Å3 |
Mr = 168.54 | Z = 3 |
Trigonal, R3m | Cu Kα radiation, λ = 1.540598 Å |
a = 5.4455 (2) Å | T = 297 K |
c = 12.2649 (9) Å | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Data collection mode: reflection |
Specimen mounting: Si syngle crystal (111) | Scan method: Stationary detector |
Refinement top
Rp = 0.100 | 5000 data points |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Uiso*/Ueq | |
B1 | 0.1725 (14) | 0.8275 (14) | 0.0371 (13) | 0.025* | |
B2 | 0.1198 (7) | 0.8803 (7) | 0.8834 (8) | 0.025* | |
N3 | 0.0 | 0.0 | 0.3744 (13) | 0.025* | |
B4 | 0.0 | 0.0 | 0.5 | 0.025* | |
Geometric parameters (Å, º) top
B1—B1i | 1.865 (17) | N3—B1xi | 1.517 (12) |
B1—B1ii | 1.865 (17) | N3—B1xii | 1.517 (12) |
B1—B2iii | 1.950 (9) | N3—B1xiii | 1.517 (12) |
B1—B2iv | 1.742 (14) | N3—B4 | 1.541 (16) |
B1—B2v | 1.743 (14) | B4—B1xiv | 2.197 (13) |
B1—N3vi | 1.517 (12) | B4—B1xv | 2.197 (13) |
B1—B4vi | 2.197 (13) | B4—B1xvi | 2.197 (13) |
B2—B1vii | 1.950 (9) | B4—B1xi | 2.197 (13) |
B2—B1iv | 1.743 (14) | B4—B1xii | 2.197 (13) |
B2—B1v | 1.742 (14) | B4—B1xiii | 2.197 (13) |
B2—B2viii | 1.956 (12) | B4—N3 | 1.541 (16) |
B2—B2ix | 1.956 (12) | B4—N3xvii | 1.541 (16) |
B2—B2x | 1.514 (11) | | |
| | | |
B1i—B1—B1ii | 98.2 (12) | B1vii—B2—B2x | 129.4 (10) |
B1i—B1—B2iii | 54.3 (8) | B1iv—B2—B1v | 107.9 (12) |
B1i—B1—B2iv | 65.4 (5) | B1iv—B2—B2viii | 104.3 (3) |
B1i—B1—B2v | 115.5 (6) | B1iv—B2—B2ix | 55.9 (5) |
B1i—B1—N3vi | 116.8 (8) | B1iv—B2—B2x | 124.0 (4) |
B1ii—B1—B2iii | 54.3 (8) | B1v—B2—B2viii | 55.9 (5) |
B1ii—B1—B2iv | 115.5 (6) | B1v—B2—B2ix | 104.3 (3) |
B1ii—B1—B2v | 65.4 (5) | B1v—B2—B2x | 124.1 (4) |
B1ii—B1—N3vi | 116.8 (8) | B2viii—B2—B2ix | 60.0 |
B2iii—B1—B2iv | 112.7 (7) | B2viii—B2—B2x | 120.5 (6) |
B2iii—B1—B2v | 112.7 (7) | B2ix—B2—B2x | 120.4 (6) |
B2iii—B1—N3vi | 106.6 (15) | B1xi—N3—B1xii | 119.90 (13) |
B2iv—B1—B2v | 68.3 (10) | B1xi—N3—B1xiii | 119.90 (13) |
B2iv—B1—N3vi | 126.3 (9) | B1xi—N3—B4 | 91.8 (11) |
B2v—B1—N3vi | 126.3 (9) | B1xii—N3—B1xiii | 119.90 (13) |
B1vii—B2—B1iv | 60.3 (7) | B1xii—N3—B4 | 91.8 (11) |
B1vii—B2—B1v | 60.3 (7) | B1xiii—N3—B4 | 91.8 (11) |
B1vii—B2—B2viii | 102.8 (4) | N3—B4—N3xvii | 180.0 |
B1vii—B2—B2ix | 102.8 (4) | | |
Symmetry codes: (i) y−1, y−x, −z; (ii) x−y+1, x+1, −z; (iii) x, y, z−1; (iv) y−1, y−x, −z+1; (v) x−y+1, x+1, −z+1; (vi) x+1/3, y+2/3, z−1/3; (vii) x, y, z+1; (viii) −y+1, x−y+2, z; (ix) y−x−1, −x+1, z; (x) −x−1/3, −y+1/3, −z+1/3; (xi) x−1/3, y−2/3, z+1/3; (xii) −y+2/3, x−y+1/3, z+1/3; (xiii) y−x−1/3, −x+1/3, z+1/3; (xiv) −x−1/3, −y−2/3, −z−2/3; (xv) y−4/3, y−x−5/3, −z−2/3; (xvi) x−y−1/3, x−5/3, −z−2/3; (xvii) −x, −y, −z+1. |
(phase_2) boron nitride
top
Crystal data top
BNx | Z = 50 |
Mr = 10.81 | F(000) = 240 |
Tetragonal, P4n2 | Dx = 2.21 Mg m−3 |
Hall symbol: P -4 -2n | Cu Kα radiation, λ = 1.540598 Å |
a = 8.7979 (18) Å | T = 297 K |
c = 5.037 (3) Å | black |
V = 389.91 Å3 | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Specimen mounting: Si syngle crystal (111) |
Radiation source: copper x-ray tube, CuKα | Data collection mode: reflection |
Yes monochromator | Scan method: Stationary detector |
Refinement top
Least-squares matrix: full | Excluded region(s): unavoidable non-uniform strain render impossible to adjust
the profile function parameters in a wide angle range. |
Rp = 0.100 | Profile function: CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = 95.838 #3(GW) = 7.893
#4(LX) = 1.057 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -0.9606 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 8.000
#4(LX) = 5.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = 20.000 #3(GW) = 30.000
#4(LX) = 0.000 #5(LY) = 0.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = -5.000 #3(GW) = 12.000
#4(LX) = 2.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -1.7500 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0050 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 786.199
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -5.000 #3(GW) = 591.058
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0 |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | Background function: GSAS Background function number 2 with 2 terms.
Cosine Fourier series
1: 305.650 2: 196.641 |
5000 data points | Preferred orientation correction: March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.65811 h= 1.000 k= 0.000 l= 0.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000 |
Crystal data top
BNx | V = 389.91 Å3 |
Mr = 10.81 | Z = 50 |
Tetragonal, P4n2 | Cu Kα radiation, λ = 1.540598 Å |
a = 8.7979 (18) Å | T = 297 K |
c = 5.037 (3) Å | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Data collection mode: reflection |
Specimen mounting: Si syngle crystal (111) | Scan method: Stationary detector |
Refinement top
Rp = 0.100 | 5000 data points |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Uiso*/Ueq | |
B3 | 0.328 | 0.095 | 0.395 | 0.025* | |
B4 | 0.095 | 0.328 | 0.395 | 0.025* | |
B5 | 0.223 | 0.078 | 0.105 | 0.025* | |
B6 | 0.078 | 0.223 | 0.105 | 0.025* | |
B7 | 0.127 | 0.127 | 0.395 | 0.025* | |
B8 | 0.25 | 0.25 | −0.078 | 0.025* | |
Geometric parameters (Å, º) top
B1—B1 | 1.865 (17) | N3—B1 | 1.517 (12) |
B1—B1 | 1.865 (17) | N3—B1 | 1.517 (12) |
B1—B2i | 1.950 (9) | N3—B1 | 1.517 (12) |
B1—B2 | 1.742 (14) | N3—B4 | 1.541 (16) |
B1—B2 | 1.743 (14) | B4—B1 | 2.197 (13) |
B1—N3 | 1.517 (12) | B4—B1 | 2.197 (13) |
B1—B4 | 2.197 (13) | B4—B1 | 2.197 (13) |
B2—B1ii | 1.950 (9) | B4—B1 | 2.197 (13) |
B2—B1 | 1.743 (14) | B4—B1 | 2.197 (13) |
B2—B1 | 1.742 (14) | B4—B1 | 2.197 (13) |
B2—B2iii | 1.956 (12) | B4—N3 | 1.541 (16) |
B2—B2iv | 1.956 (12) | B4—N3 | 1.541 (16) |
B2—B2 | 1.514 (11) | | |
| | | |
B1—B1—B1 | 98.2 (12) | B1ii—B2—B2 | 129.4 (10) |
B1—B1—B2i | 54.3 (8) | B1—B2—B1 | 107.9 (12) |
B1—B1—B2 | 65.4 (5) | B1—B2—B2iii | 104.3 (3) |
B1—B1—B2 | 115.5 (6) | B1—B2—B2iv | 55.9 (5) |
B1—B1—N3 | 116.8 (8) | B1—B2—B2 | 124.0 (4) |
B1—B1—B2i | 54.3 (8) | B1—B2—B2iii | 55.9 (5) |
B1—B1—B2 | 115.5 (6) | B1—B2—B2iv | 104.3 (3) |
B1—B1—B2 | 65.4 (5) | B1—B2—B2 | 124.1 (4) |
B1—B1—N3 | 116.8 (8) | B2iii—B2—B2iv | 60.0 |
B2i—B1—B2 | 112.7 (7) | B2iii—B2—B2 | 120.5 (6) |
B2i—B1—B2 | 112.7 (7) | B2iv—B2—B2 | 120.4 (6) |
B2i—B1—N3 | 106.6 (15) | B1—N3—B1 | 119.90 (13) |
B2—B1—B2 | 68.3 (10) | B1—N3—B1 | 119.90 (13) |
B2—B1—N3 | 126.3 (9) | B1—N3—B4 | 91.8 (11) |
B2—B1—N3 | 126.3 (9) | B1—N3—B1 | 119.90 (13) |
B1ii—B2—B1 | 60.3 (7) | B1—N3—B4 | 91.8 (11) |
B1ii—B2—B1 | 60.3 (7) | B1—N3—B4 | 91.8 (11) |
B1ii—B2—B2iii | 102.8 (4) | N3—B4—N3 | 180.0 |
B1ii—B2—B2iv | 102.8 (4) | | |
Symmetry codes: (i) x, y, z−1; (ii) x, y, z+1; (iii) y+1, −x+2, −z; (iv) −x−1, −y+1, z. |
(phase_3) boron nitride
top
Crystal data top
BN | Z = 2 |
Mr = 24.82 | F(000) = 24 |
Hexagonal, P6m2 | Dx = 2.298 Mg m−3 |
Hall symbol: P -6 2 | Cu Kα radiation, λ = 1.540598 Å |
a = 2.49824 (8) Å | T = 297 K |
c = 6.6357 (2) Å | black |
V = 35.87 (1) Å3 | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Specimen mounting: Si syngle crystal (111) |
Radiation source: copper x-ray tube, CuKα | Data collection mode: reflection |
Yes monochromator | Scan method: Stationary detector |
Refinement top
Least-squares matrix: full | Excluded region(s): unavoidable non-uniform strain render impossible to adjust
the profile function parameters in a wide angle range. |
Rp = 0.100 | Profile function: CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = 95.838 #3(GW) = 7.893
#4(LX) = 1.057 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -0.9606 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 8.000
#4(LX) = 5.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = 20.000 #3(GW) = 30.000
#4(LX) = 0.000 #5(LY) = 0.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = -5.000 #3(GW) = 12.000
#4(LX) = 2.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -1.7500 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0050 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 786.199
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -5.000 #3(GW) = 591.058
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0 |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | Background function: GSAS Background function number 2 with 2 terms.
Cosine Fourier series
1: 305.650 2: 196.641 |
5000 data points | Preferred orientation correction: March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.65811 h= 1.000 k= 0.000 l= 0.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000 |
Crystal data top
BN | V = 35.87 (1) Å3 |
Mr = 24.82 | Z = 2 |
Hexagonal, P6m2 | Cu Kα radiation, λ = 1.540598 Å |
a = 2.49824 (8) Å | T = 297 K |
c = 6.6357 (2) Å | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Data collection mode: reflection |
Specimen mounting: Si syngle crystal (111) | Scan method: Stationary detector |
Refinement top
Rp = 0.100 | 5000 data points |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Uiso*/Ueq | |
B1 | 0.0 | 0.0 | 0.5 | 0.025* | |
B2 | 0.3333 | 0.6667 | 0.0 | 0.025* | |
N3 | 0.0 | 0.0 | 0.0 | 0.025* | |
N4 | 0.3333 | 0.6667 | 0.5 | 0.025* | |
Geometric parameters (Å, º) top
B1—B1 | 1.865 (17) | N3—B1 | 1.517 (12) |
B1—B1 | 1.865 (17) | N3—B1 | 1.517 (12) |
B1—B2i | 1.950 (9) | N3—B1 | 1.517 (12) |
B1—B2 | 1.742 (14) | N3—B4 | 1.541 (16) |
B1—B2 | 1.743 (14) | B4—B1 | 2.197 (13) |
B1—N3 | 1.517 (12) | B4—B1 | 2.197 (13) |
B1—B4 | 2.197 (13) | B4—B1 | 2.197 (13) |
B2—B1ii | 1.950 (9) | B4—B1 | 2.197 (13) |
B2—B1 | 1.743 (14) | B4—B1 | 2.197 (13) |
B2—B1 | 1.742 (14) | B4—B1 | 2.197 (13) |
B2—B2iii | 1.956 (12) | B4—N3 | 1.541 (16) |
B2—B2iv | 1.956 (12) | B4—N3 | 1.541 (16) |
B2—B2 | 1.514 (11) | | |
| | | |
B1—B1—B1 | 98.2 (12) | B1ii—B2—B2 | 129.4 (10) |
B1—B1—B2i | 54.3 (8) | B1—B2—B1 | 107.9 (12) |
B1—B1—B2 | 65.4 (5) | B1—B2—B2iii | 104.3 (3) |
B1—B1—B2 | 115.5 (6) | B1—B2—B2iv | 55.9 (5) |
B1—B1—N3 | 116.8 (8) | B1—B2—B2 | 124.0 (4) |
B1—B1—B2i | 54.3 (8) | B1—B2—B2iii | 55.9 (5) |
B1—B1—B2 | 115.5 (6) | B1—B2—B2iv | 104.3 (3) |
B1—B1—B2 | 65.4 (5) | B1—B2—B2 | 124.1 (4) |
B1—B1—N3 | 116.8 (8) | B2iii—B2—B2iv | 60.0 |
B2i—B1—B2 | 112.7 (7) | B2iii—B2—B2 | 120.5 (6) |
B2i—B1—B2 | 112.7 (7) | B2iv—B2—B2 | 120.4 (6) |
B2i—B1—N3 | 106.6 (15) | B1—N3—B1 | 119.90 (13) |
B2—B1—B2 | 68.3 (10) | B1—N3—B1 | 119.90 (13) |
B2—B1—N3 | 126.3 (9) | B1—N3—B4 | 91.8 (11) |
B2—B1—N3 | 126.3 (9) | B1—N3—B1 | 119.90 (13) |
B1ii—B2—B1 | 60.3 (7) | B1—N3—B4 | 91.8 (11) |
B1ii—B2—B1 | 60.3 (7) | B1—N3—B4 | 91.8 (11) |
B1ii—B2—B2iii | 102.8 (4) | N3—B4—N3 | 180.0 |
B1ii—B2—B2iv | 102.8 (4) | | |
Symmetry codes: (i) x, y, z−1; (ii) x, y, z+1; (iii) y−x+1, −x+2, −z; (iv) −y−1, x−y+1, z. |
Crystal data top
B | Z = 105 |
Mr = 10.81 | F(000) = 520 |
Trigonal, R3mr | Dx = 2.29 Mg m−3 |
Hall symbol: -P 3 2 | Cu Kα radiation, λ = 1.540598 Å |
a = 10.1398 (3) Å | T = 297 K |
c = 10.1398 Å | black |
V = 823.05 Å3 | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Specimen mounting: Si syngle crystal (111) |
Radiation source: copper x-ray tube, CuKα | Data collection mode: reflection |
Yes monochromator | Scan method: Stationary detector |
Refinement top
Least-squares matrix: full | Excluded region(s): unavoidable non-uniform strain render impossible to adjust
the profile function parameters in a wide angle range. |
Rp = 0.100 | Profile function: CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = 95.838 #3(GW) = 7.893
#4(LX) = 1.057 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -0.9606 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 8.000
#4(LX) = 5.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = 20.000 #3(GW) = 30.000
#4(LX) = 0.000 #5(LY) = 0.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = -5.000 #3(GW) = 12.000
#4(LX) = 2.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -1.7500 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0050 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 786.199
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -5.000 #3(GW) = 591.058
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0 |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | Background function: GSAS Background function number 2 with 2 terms.
Cosine Fourier series
1: 305.650 2: 196.641 |
5000 data points | Preferred orientation correction: March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.65811 h= 1.000 k= 0.000 l= 0.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000 |
Crystal data top
B | V = 823.05 Å3 |
Mr = 10.81 | Z = 105 |
Trigonal, R3mr | Cu Kα radiation, λ = 1.540598 Å |
a = 10.1398 (3) Å | T = 297 K |
c = 10.1398 Å | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Data collection mode: reflection |
Specimen mounting: Si syngle crystal (111) | Scan method: Stationary detector |
Refinement top
Rp = 0.100 | 5000 data points |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Uiso*/Ueq | |
B1 | 0.0025 | 0.0025 | 0.168 | 0.025* | |
B2 | 0.1008 | 0.1008 | 0.8374 | 0.025* | |
B3 | 0.9933 | 0.9933 | 0.6698 | 0.025* | |
B4 | 0.1032 | 0.1032 | 0.4921 | 0.025* | |
B5 | 0.17777 | 0.3473 | 0.0033 | 0.025* | |
B6 | 0.1673 | 0.5521 | 0.8921 | 0.025* | |
B7 | 0.1983 | 0.1983 | 0.6874 | 0.025* | |
B8 | 0.3765 | 0.6826 | 0.2024 | 0.025* | |
B9 | 0.3622 | 0.5811 | 0.0976 | 0.025* | |
B10 | 0.1991 | 0.1991 | 0.5061 | 0.025* | |
B11 | 0.3873 | 0.3873 | 0.569 | 0.025* | |
B12 | 0.4895 | 0.4895 | 0.2178 | 0.025* | |
B13 | 0.3843 | 0.3843 | 0.2131 | 0.025* | |
B14 | 0.3848 | 0.3848 | 0.3848 | 0.025* | |
B15 | 0.5 | 0.5 | 0.5 | 0.025* | |
Geometric parameters (Å, º) top
B1—B1i | 1.865 (17) | N3—B1 | 1.517 (12) |
B1—B1ii | 1.865 (17) | N3—B1 | 1.517 (12) |
B1—B2iii | 1.950 (9) | N3—B1 | 1.517 (12) |
B1—B2iv | 1.742 (14) | N3—B4 | 1.541 (16) |
B1—B2v | 1.743 (14) | B4—B1 | 2.197 (13) |
B1—N3 | 1.517 (12) | B4—B1 | 2.197 (13) |
B1—B4 | 2.197 (13) | B4—B1 | 2.197 (13) |
B2—B1vi | 1.950 (9) | B4—B1 | 2.197 (13) |
B2—B1iv | 1.743 (14) | B4—B1 | 2.197 (13) |
B2—B1v | 1.742 (14) | B4—B1 | 2.197 (13) |
B2—B2vii | 1.956 (12) | B4—N3 | 1.541 (16) |
B2—B2viii | 1.956 (12) | B4—N3ix | 1.541 (16) |
B2—B2 | 1.514 (11) | | |
| | | |
B1i—B1—B1ii | 98.2 (12) | B1vi—B2—B2 | 129.4 (10) |
B1i—B1—B2iii | 54.3 (8) | B1iv—B2—B1v | 107.9 (12) |
B1i—B1—B2iv | 65.4 (5) | B1iv—B2—B2vii | 104.3 (3) |
B1i—B1—B2v | 115.5 (6) | B1iv—B2—B2viii | 55.9 (5) |
B1i—B1—N3 | 116.8 (8) | B1iv—B2—B2 | 124.0 (4) |
B1ii—B1—B2iii | 54.3 (8) | B1v—B2—B2vii | 55.9 (5) |
B1ii—B1—B2iv | 115.5 (6) | B1v—B2—B2viii | 104.3 (3) |
B1ii—B1—B2v | 65.4 (5) | B1v—B2—B2 | 124.1 (4) |
B1ii—B1—N3 | 116.8 (8) | B2vii—B2—B2viii | 60.0 |
B2iii—B1—B2iv | 112.7 (7) | B2vii—B2—B2 | 120.5 (6) |
B2iii—B1—B2v | 112.7 (7) | B2viii—B2—B2 | 120.4 (6) |
B2iii—B1—N3 | 106.6 (15) | B1—N3—B1 | 119.90 (13) |
B2iv—B1—B2v | 68.3 (10) | B1—N3—B1 | 119.90 (13) |
B2iv—B1—N3 | 126.3 (9) | B1—N3—B4 | 91.8 (11) |
B2v—B1—N3 | 126.3 (9) | B1—N3—B1 | 119.90 (13) |
B1vi—B2—B1iv | 60.3 (7) | B1—N3—B4 | 91.8 (11) |
B1vi—B2—B1v | 60.3 (7) | B1—N3—B4 | 91.8 (11) |
B1vi—B2—B2vii | 102.8 (4) | N3—B4—N3ix | 180.0 |
B1vi—B2—B2viii | 102.8 (4) | | |
Symmetry codes: (i) −z−1, −x, −y; (ii) −y+1, −z+1, −x; (iii) x, y, z−1; (iv) −z−1, −x, −y+1; (v) −y+1, −z+1, −x+1; (vi) x, y, z+1; (vii) z+1, x+2, y; (viii) y−1, z+1, x; (ix) −x, −y, −z+1. |
Crystal data top
H3BO3 | Z = 6 |
Mr = 58.81 | F(000) = 174 |
Trigonal, P32 | Dx = 1.42 Mg m−3 |
Hall symbol: P 32 | Cu Kα radiation, λ = 1.540598 Å |
a = 7.0453 Å | T = 297 K |
c = 9.60 (1) Å | black |
V = 412.67 Å3 | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Specimen mounting: Si syngle crystal (111) |
Radiation source: copper x-ray tube, CuKα | Data collection mode: reflection |
Yes monochromator | Scan method: Stationary detector |
Refinement top
Least-squares matrix: full | Excluded region(s): unavoidable non-uniform strain render impossible to adjust
the profile function parameters in a wide angle range. |
Rp = 0.100 | Profile function: CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = 95.838 #3(GW) = 7.893
#4(LX) = 1.057 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -0.9606 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 8.000
#4(LX) = 5.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = 20.000 #3(GW) = 30.000
#4(LX) = 0.000 #5(LY) = 0.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = -5.000 #3(GW) = 12.000
#4(LX) = 2.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -1.7500 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0050 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 786.199
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -5.000 #3(GW) = 591.058
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0 |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | Background function: GSAS Background function number 2 with 2 terms.
Cosine Fourier series
1: 305.650 2: 196.641 |
5000 data points | Preferred orientation correction: March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.65811 h= 1.000 k= 0.000 l= 0.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000 |
Crystal data top
H3BO3 | V = 412.67 Å3 |
Mr = 58.81 | Z = 6 |
Trigonal, P32 | Cu Kα radiation, λ = 1.540598 Å |
a = 7.0453 Å | T = 297 K |
c = 9.60 (1) Å | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Data collection mode: reflection |
Specimen mounting: Si syngle crystal (111) | Scan method: Stationary detector |
Refinement top
Rp = 0.100 | 5000 data points |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Uiso*/Ueq | |
B1 | 0.1837 | 0.6403 | 0.2849 | 0.025* | |
B2 | 0.518 | 0.3069 | 0.2964 | 0.025* | |
O3 | 0.0621 | 0.7393 | 0.2805 | 0.025* | |
O4 | 0.0864 | 0.4195 | 0.2808 | 0.025* | |
O5 | 0.409 | 0.765 | 0.2869 | 0.025* | |
O6 | 0.6437 | 0.2103 | 0.2929 | 0.025* | |
O7 | 0.295 | 0.1832 | 0.2998 | 0.025* | |
O8 | 0.6136 | 0.5294 | 0.2904 | 0.025* | |
Geometric parameters (Å, º) top
B1—B1 | 1.865 (17) | N3—B1 | 1.517 (12) |
B1—B1 | 1.865 (17) | N3—B1 | 1.517 (12) |
B1—B2i | 1.950 (9) | N3—B1 | 1.517 (12) |
B1—B2 | 1.742 (14) | N3—B4 | 1.541 (16) |
B1—B2 | 1.743 (14) | B4—B1 | 2.197 (13) |
B1—N3 | 1.517 (12) | B4—B1 | 2.197 (13) |
B1—B4 | 2.197 (13) | B4—B1 | 2.197 (13) |
B2—B1ii | 1.950 (9) | B4—B1 | 2.197 (13) |
B2—B1 | 1.743 (14) | B4—B1 | 2.197 (13) |
B2—B1 | 1.742 (14) | B4—B1 | 2.197 (13) |
B2—B2iii | 1.956 (12) | B4—N3 | 1.541 (16) |
B2—B2iv | 1.956 (12) | B4—N3 | 1.541 (16) |
B2—B2 | 1.514 (11) | | |
| | | |
B1—B1—B1 | 98.2 (12) | B1ii—B2—B2 | 129.4 (10) |
B1—B1—B2i | 54.3 (8) | B1—B2—B1 | 107.9 (12) |
B1—B1—B2 | 65.4 (5) | B1—B2—B2iii | 104.3 (3) |
B1—B1—B2 | 115.5 (6) | B1—B2—B2iv | 55.9 (5) |
B1—B1—N3 | 116.8 (8) | B1—B2—B2 | 124.0 (4) |
B1—B1—B2i | 54.3 (8) | B1—B2—B2iii | 55.9 (5) |
B1—B1—B2 | 115.5 (6) | B1—B2—B2iv | 104.3 (3) |
B1—B1—B2 | 65.4 (5) | B1—B2—B2 | 124.1 (4) |
B1—B1—N3 | 116.8 (8) | B2iii—B2—B2iv | 60.0 |
B2i—B1—B2 | 112.7 (7) | B2iii—B2—B2 | 120.5 (6) |
B2i—B1—B2 | 112.7 (7) | B2iv—B2—B2 | 120.4 (6) |
B2i—B1—N3 | 106.6 (15) | B1—N3—B1 | 119.90 (13) |
B2—B1—B2 | 68.3 (10) | B1—N3—B1 | 119.90 (13) |
B2—B1—N3 | 126.3 (9) | B1—N3—B4 | 91.8 (11) |
B2—B1—N3 | 126.3 (9) | B1—N3—B1 | 119.90 (13) |
B1ii—B2—B1 | 60.3 (7) | B1—N3—B4 | 91.8 (11) |
B1ii—B2—B1 | 60.3 (7) | B1—N3—B4 | 91.8 (11) |
B1ii—B2—B2iii | 102.8 (4) | N3—B4—N3 | 180.0 |
B1ii—B2—B2iv | 102.8 (4) | | |
Symmetry codes: (i) x, y, z−1; (ii) x, y, z+1; (iii) −y+1, x−y+2, z+2/3; (iv) y−x−1, −x+1, z+1/3. |
(phase_6) boron nitride
top
Crystal data top
BN | Z = 2 |
Mr = 24.82 | F(000) = 24 |
Hexagonal, P6m2 | Dx = 2.236 Mg m−3 |
Hall symbol: P -6 2 | Cu Kα radiation, λ = 1.540598 Å |
a = 2.54 Å | T = 297 K |
c = 6.598 (3) Å | black |
V = 36.86 Å3 | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Specimen mounting: Si syngle crystal (111) |
Radiation source: copper x-ray tube, CuKα | Data collection mode: reflection |
Yes monochromator | Scan method: Stationary detector |
Refinement top
Least-squares matrix: full | Excluded region(s): unavoidable non-uniform strain render impossible to adjust
the profile function parameters in a wide angle range. |
Rp = 0.100 | Profile function: CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = 95.838 #3(GW) = 7.893
#4(LX) = 1.057 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -0.9606 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 8.000
#4(LX) = 5.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = 20.000 #3(GW) = 30.000
#4(LX) = 0.000 #5(LY) = 0.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0010 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 5.000 #2(GV) = -5.000 #3(GW) = 12.000
#4(LX) = 2.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = -1.7500 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0050 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -2.000 #3(GW) = 786.199
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0, CW Profile function number 2 with 18 terms
Profile coefficients for Simpson's rule integration of pseudovoigt function
C.J. Howard (1982). J. Appl. Cryst.,15,615-620.
P. Thompson, D.E. Cox & J.B. Hastings (1987). J. Appl. Cryst.,20,79-83.
#1(GU) = 2.000 #2(GV) = -5.000 #3(GW) = 591.058
#4(LX) = 1.000 #5(LY) = 1.000 #6(trns) = 0.000
#7(asym) = 0.0000 #8(shft) = 0.0000 #9(GP) = 0.000
#10(stec)= 0.00 #11(ptec)= 0.00 #12(sfec)= 0.00
#13(L11) = 0.000 #14(L22) = 0.000 #15(L33) = 0.000
#16(L12) = 0.000 #17(L13) = 0.000 #18(L23) = 0.000
Peak tails are ignored where the intensity is below 0.0100 times the peak
Aniso. broadening axis 0.0 0.0 1.0 |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | Background function: GSAS Background function number 2 with 2 terms.
Cosine Fourier series
1: 305.650 2: 196.641 |
5000 data points | Preferred orientation correction: March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.65811 h= 1.000 k= 0.000 l= 0.000, March-Dollase
AXIS 1 Ratio= 1.00000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000, March-Dollase
AXIS 1 Ratio= 0.10000 h= 0.000 k= 0.000 l= 1.000 |
Crystal data top
BN | V = 36.86 Å3 |
Mr = 24.82 | Z = 2 |
Hexagonal, P6m2 | Cu Kα radiation, λ = 1.540598 Å |
a = 2.54 Å | T = 297 K |
c = 6.598 (3) Å | flat_sheet, 0.2 × 0.2 mm |
Data collection top
G3000 TEXT Inel diffractometer | Data collection mode: reflection |
Specimen mounting: Si syngle crystal (111) | Scan method: Stationary detector |
Refinement top
Rp = 0.100 | 5000 data points |
Rwp = 0.136 | 14 parameters |
Rexp = 0.034 | 0 restraints |
R(F2) = 0.02645 | (Δ/σ)max = 0.21 |
χ2 = 15.761 | |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Uiso*/Ueq | |
B1 | 0.0 | 0.0 | 0.5 | 0.025* | |
B2 | 0.3333 | 0.6667 | 0.0 | 0.025* | |
N3 | 0.0 | 0.0 | 0.0 | 0.025* | |
N4 | 0.3333 | 0.6667 | 0.5 | 0.025* | |
Geometric parameters (Å, º) top
B1—B1 | 1.865 (17) | N3—B1 | 1.517 (12) |
B1—B1 | 1.865 (17) | N3—B1 | 1.517 (12) |
B1—B2i | 1.950 (9) | N3—B1 | 1.517 (12) |
B1—B2 | 1.742 (14) | N3—B4 | 1.541 (16) |
B1—B2 | 1.743 (14) | B4—B1 | 2.197 (13) |
B1—N3 | 1.517 (12) | B4—B1 | 2.197 (13) |
B1—B4 | 2.197 (13) | B4—B1 | 2.197 (13) |
B2—B1ii | 1.950 (9) | B4—B1 | 2.197 (13) |
B2—B1 | 1.743 (14) | B4—B1 | 2.197 (13) |
B2—B1 | 1.742 (14) | B4—B1 | 2.197 (13) |
B2—B2iii | 1.956 (12) | B4—N3 | 1.541 (16) |
B2—B2iv | 1.956 (12) | B4—N3 | 1.541 (16) |
B2—B2 | 1.514 (11) | | |
| | | |
B1—B1—B1 | 98.2 (12) | B1ii—B2—B2 | 129.4 (10) |
B1—B1—B2i | 54.3 (8) | B1—B2—B1 | 107.9 (12) |
B1—B1—B2 | 65.4 (5) | B1—B2—B2iii | 104.3 (3) |
B1—B1—B2 | 115.5 (6) | B1—B2—B2iv | 55.9 (5) |
B1—B1—N3 | 116.8 (8) | B1—B2—B2 | 124.0 (4) |
B1—B1—B2i | 54.3 (8) | B1—B2—B2iii | 55.9 (5) |
B1—B1—B2 | 115.5 (6) | B1—B2—B2iv | 104.3 (3) |
B1—B1—B2 | 65.4 (5) | B1—B2—B2 | 124.1 (4) |
B1—B1—N3 | 116.8 (8) | B2iii—B2—B2iv | 60.0 |
B2i—B1—B2 | 112.7 (7) | B2iii—B2—B2 | 120.5 (6) |
B2i—B1—B2 | 112.7 (7) | B2iv—B2—B2 | 120.4 (6) |
B2i—B1—N3 | 106.6 (15) | B1—N3—B1 | 119.90 (13) |
B2—B1—B2 | 68.3 (10) | B1—N3—B1 | 119.90 (13) |
B2—B1—N3 | 126.3 (9) | B1—N3—B4 | 91.8 (11) |
B2—B1—N3 | 126.3 (9) | B1—N3—B1 | 119.90 (13) |
B1ii—B2—B1 | 60.3 (7) | B1—N3—B4 | 91.8 (11) |
B1ii—B2—B1 | 60.3 (7) | B1—N3—B4 | 91.8 (11) |
B1ii—B2—B2iii | 102.8 (4) | N3—B4—N3 | 180.0 |
B1ii—B2—B2iv | 102.8 (4) | | |
Symmetry codes: (i) x, y, z−1; (ii) x, y, z+1; (iii) y−x+1, −x+2, −z; (iv) −y−1, x−y+1, z. |
Experimental details
| (phase_1) | (phase_2) | (phase_3) | (phase_4) |
Crystal data |
Chemical formula | B13N2 | BNx | BN | B |
Mr | 168.54 | 10.81 | 24.82 | 10.81 |
Crystal system, space group | Trigonal, R3m | Tetragonal, P4n2 | Hexagonal, P6m2 | Trigonal, R3mr |
Temperature (K) | 297 | 297 | 297 | 297 |
a, b, c (Å) | 5.4455 (2), 5.44546, 12.2649 (9) | 8.7979 (18), 8.7979, 5.037 (3) | 2.49824 (8), 2.49824, 6.6357 (2) | 10.1398 (3), 10.1398, 10.1398 |
α, β, γ (°) | 90, 90, 120 | 90, 90, 90 | 90, 90, 120 | 65.351 (3), 65.3509, 65.3509 |
V (Å3) | 314.97 (4) | 389.91 | 35.87 (1) | 823.05 |
Z | 3 | 50 | 2 | 105 |
Radiation type | Cu Kα, λ = 1.540598 Å | Cu Kα, λ = 1.540598 Å | Cu Kα, λ = 1.540598 Å | Cu Kα, λ = 1.540598 Å |
Specimen shape, size (mm) | Flat_sheet, 0.2 × 0.2 | Flat_sheet, 0.2 × 0.2 | Flat_sheet, 0.2 × 0.2 | Flat_sheet, 0.2 × 0.2 |
|
Data collection |
Diffractometer | G3000 TEXT Inel diffractometer | G3000 TEXT Inel diffractometer | G3000 TEXT Inel diffractometer | G3000 TEXT Inel diffractometer |
Specimen mounting | Si syngle crystal (111) | Si syngle crystal (111) | Si syngle crystal (111) | Si syngle crystal (111) |
Data collection mode | Reflection | Reflection | Reflection | Reflection |
Scan method | Stationary detector | Stationary detector | Stationary detector | Stationary detector |
2θ values (°) | 2θfixed = ? | 2θfixed = ? | 2θfixed = ? | 2θfixed = ? |
|
Refinement |
R factors and goodness of fit | Rp = 0.100, Rwp = 0.136, Rexp = 0.034, R(F2) = 0.02645, χ2 = 15.761 | Rp = 0.100, Rwp = 0.136, Rexp = 0.034, R(F2) = 0.02645, χ2 = 15.761 | Rp = 0.100, Rwp = 0.136, Rexp = 0.034, R(F2) = 0.02645, χ2 = 15.761 | Rp = 0.100, Rwp = 0.136, Rexp = 0.034, R(F2) = 0.02645, χ2 = 15.761 |
No. of data points | 5000 | 5000 | 5000 | 5000 |
No. of parameters | 14 | 14 | 14 | 14 |
(Δ/σ)max | 0.21 | 0.21 | 0.21 | 0.21 |
| (phase_5) | (phase_6) |
Crystal data |
Chemical formula | H3BO3 | BN |
Mr | 58.81 | 24.82 |
Crystal system, space group | Trigonal, P32 | Hexagonal, P6m2 |
Temperature (K) | 297 | 297 |
a, b, c (Å) | 7.0453, 7.0453, 9.60 (1) | 2.54, 2.54, 6.598 (3) |
α, β, γ (°) | 90, 90, 120 | 90, 90, 120 |
V (Å3) | 412.67 | 36.86 |
Z | 6 | 2 |
Radiation type | Cu Kα, λ = 1.540598 Å | Cu Kα, λ = 1.540598 Å |
Specimen shape, size (mm) | Flat_sheet, 0.2 × 0.2 | Flat_sheet, 0.2 × 0.2 |
|
Data collection |
Diffractometer | G3000 TEXT Inel diffractometer | G3000 TEXT Inel diffractometer |
Specimen mounting | Si syngle crystal (111) | Si syngle crystal (111) |
Data collection mode | Reflection | Reflection |
Scan method | Stationary detector | Stationary detector |
2θ values (°) | 2θfixed = ? | 2θfixed = ? |
|
Refinement |
R factors and goodness of fit | Rp = 0.100, Rwp = 0.136, Rexp = 0.034, R(F2) = 0.02645, χ2 = 15.761 | Rp = 0.100, Rwp = 0.136, Rexp = 0.034, R(F2) = 0.02645, χ2 = 15.761 |
No. of data points | 5000 | 5000 |
No. of parameters | 14 | 14 |
(Δ/σ)max | 0.21 | 0.21 |
The fortunate combination of lightness, hardness, strength, chemical inertness and high cross section for neutron absorption has suited boron and boron-rich phases (B6O, B4 + xC1-x etc.) to many technological applications (Emin, 1987; McMillan, 2002). Very recently, we have synthesized a new member of this group, boron subnitride `B6N'. From the electron energy loss spectroscopy data, the stoichiometry of the phase has been determined to be B6±1N, and from the X-ray study as B13N2. The phase has a structure similar in some respect to those of α -rhombohedral boron (Decker & Kasper, 1959), B4 + xC1 - x (Kirfel et al., 1979; Aselage et al., 1997) and B6O (Higashi et al., 1991; Aselage et al., 1997). However, the relative line intensities correspond to none of these three structures. The similarity is greatest to B4 + xC1 - x, which has the same unit cell, space group and atom sites as the nitride. Studies of the carbide by X-ray diffraction, Raman spectroscopy and, especially, 13C and 11B nuclear magnetic resonance revealed that a very complicated atomic distribution of carbon all over the lattice takes place via C/B disorder, resulting in C—C—C, B—B—C and C—B—C intericosahedral chains, as well as B11C and B12 icosahedra (Aselage et al., 1997; Tallant et al., 1989; Bullett, 1982; Lundstrom, 1997). In the case of `B6N', our Raman data have supported the suggestion that the `B6N' structure is similar to that of boron carbide, B4 + xC1 - x, but with no evidence of N/B disorder of the type seen in the carbide. Thus, the nitride features N—B—N linkages, but no N—N—N linkages, which would be much less stable than the carbon analogues in any case.
In the present work, the structure of the new boron subnitride B13N2 has been determined by Rietveld refinement of powder diffraction data collected at ambient conditions (Fig. 1). The Bragg lines of the compound have been indexed in the rhombohedral cell, with lattice parameters a = 5.4455 (2) Å and c = 12.2649 (9) Å. In order to check all possibilities of the atom type distribution over symmetry-independent site positions, we have performed a Rietveld refinement of several unit cells of the `B6N' compound. All the cells contained atoms B1 and B2 (18h Wyckoff position), while the 6c and 3b Wyckoff positions were allowed to be occupied by either B or N atoms. Satisfactory refinement was achieved only in the case of the starting unit cell containing two symmetry-independent B atoms of the 18h Wickoff position, one independent N atom in the 6c position, and one B atom in the 3b position (Fig. 2). The site occupancies of the atoms of each crystallographic type are close to unity, so the synthesized phase has the B13N2 stoichiometry.