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It is demonstrated that H atoms can be located by the spectroscopic method of deuteron NMR. The requirement is that the `heavy-atom' positions are known from diffraction studies. The technique allows an accuracy of the order of 0.01 Å. The compound studied is ammonium persulphate (APS), (NH_4)_2S_2O_8. APS crystallizes in space group P2_1/n with lattice parameters a = 6.1340 (2), b = 7.9324 (3), c = 7.7541 (3) Å and \beta = 94.966 (1)° at T = 118 K. In perdeuterated crystals of APS, only one of the deuterons of every ND^+_4 ion becomes localized at low temperatures. Therefore, most of this work uses samples with 9% deuteration. In such crystals, most of the ammonium ions containing deuterons come in the form of NDH^+_3 ions. At T \,\lt\, 25 K, the single deuteron of these ions becomes localized in one of four equilibrium sites. The deuteron site occupancies differ from each other and are measured at 17 K. The deuterons are located in three steps. (i) The deuteron quadrupole-coupling (QC) tensors are measured at 17 K. Their unique principal directions are identified, as is well justified, with the N-D bond directions. (ii) The fine structure of a deuteron NMR line is analyzed in terms of the magnetic dipole-dipole interactions between all nuclei in an NDH^+_3 ion to obtain the N-D and D-H internuclear distances. (iii) An empirical relation between deuteron QC constants and D\cdotsO distances in N-D\cdotsO hydrogen bonds is exploited to assign the N-D bond vectors to the appropriate N atom of which there are four in the unit cell. The results are highly relevant for an understanding of the complex tunnelling and stochastic reorientation dynamics of the ammonium ions in APS. They are verified by a complementary X-ray diffraction study.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768102011199/sn0024sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768102011199/sn0024Isup2.hkl
Contains datablock I

Computing details top

Data collection: Collect Package, BRUKER NONIUS B.V. 1999; cell refinement: Collect Package, BRUKER NONIUS B.V. 1999; data reduction: Collect Package, BRUKER NONIUS B.V. 1999; program(s) used to solve structure: SHELXS97, Sheldrick 1990; program(s) used to refine structure: SHELXL97, Sheldrick 1997; molecular graphics: SCHAKAL 99, Keller 1999.

Figures top
[Figure 1]
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[Figure 3]
[Figure 4]
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[Figure 8]
ammonium persulfate-d8 top
Crystal data top
(SO4)2(NH4)2F(000) = 236
Mr = 228.20Dx = 2.016 Mg m3
Monoclinic, P21/nMo Kα radiation, λ = 0.71073 Å
a = 6.1340 (2) ÅCell parameters from 786 reflections
b = 7.9324 (3) Åθ = 1.0–27.9°
c = 7.7541 (3) ŵ = 0.73 mm1
β = 94.966 (1)°T = 118 K
V = 375.88 (2) Å3Fragment, colourless
Z = 20.32 × 0.20 × 0.20 mm
Data collection top
NONIUS KappaCCD diffraktometer
diffractometer
768 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.024
Graphite monochromatorθmax = 27.9°, θmin = 5.1°
phi– and ω scansh = 88
1393 measured reflectionsk = 1010
791 independent reflectionsl = 1010
Refinement top
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.028Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.069Refined isotropic
S = 1.07 w = 1/[σ2(Fo2) + (0.0151P)2 + 0.2285P]
where P = (Fo2 + 2Fc2)/3
791 reflections(Δ/σ)max = 0.002
71 parametersΔρmax = 0.25 e Å3
0 restraintsΔρmin = 0.30 e Å3
Crystal data top
(SO4)2(NH4)2V = 375.88 (2) Å3
Mr = 228.20Z = 2
Monoclinic, P21/nMo Kα radiation
a = 6.1340 (2) ŵ = 0.73 mm1
b = 7.9324 (3) ÅT = 118 K
c = 7.7541 (3) Å0.32 × 0.20 × 0.20 mm
β = 94.966 (1)°
Data collection top
NONIUS KappaCCD diffraktometer
diffractometer
768 reflections with I > 2σ(I)
1393 measured reflectionsRint = 0.024
791 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0280 restraints
wR(F2) = 0.069Refined isotropic
S = 1.07Δρmax = 0.25 e Å3
791 reflectionsΔρmin = 0.30 e Å3
71 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
S10.21386 (5)0.85461 (4)0.63745 (4)0.01348 (16)
O30.11829 (13)1.01867 (13)0.52348 (13)0.0213 (3)
O10.18431 (17)0.71093 (13)0.52550 (13)0.0242 (3)
O40.08329 (16)0.84816 (12)0.78417 (12)0.0191 (2)
O20.43508 (14)0.91084 (13)0.67523 (13)0.0198 (2)
N10.2287 (2)0.88530 (17)0.14819 (16)0.0172 (3)
D10.217 (4)0.862 (2)0.042 (3)0.036 (6)*
D20.352 (4)0.908 (3)0.182 (3)0.036 (5)*
D30.191 (4)0.798 (3)0.196 (3)0.048 (7)*
D40.143 (3)0.963 (3)0.169 (2)0.022 (4)*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
S10.0126 (2)0.0144 (2)0.0133 (2)0.00095 (10)0.00006 (13)0.00041 (10)
O30.0098 (5)0.0242 (5)0.0285 (6)0.0041 (4)0.0056 (4)0.0105 (4)
O10.0247 (5)0.0233 (6)0.0247 (5)0.0002 (4)0.0030 (4)0.0107 (4)
O40.0188 (5)0.0248 (5)0.0141 (5)0.0022 (4)0.0028 (4)0.0008 (3)
O20.0130 (4)0.0217 (5)0.0239 (5)0.0003 (4)0.0028 (4)0.0016 (4)
N10.0161 (6)0.0173 (6)0.0181 (6)0.0005 (4)0.0002 (5)0.0002 (4)
Geometric parameters (Å, º) top
S1—O21.4344 (9)N1—D10.84 (2)
S1—O11.4346 (10)N1—D20.80 (2)
S1—O41.4478 (10)N1—D30.83 (3)
S1—O31.6518 (10)N1—D40.84 (2)
O3—O3i1.4949 (17)
O2—S1—O1116.00 (6)D1—N1—D2112 (2)
O2—S1—O4115.36 (6)D1—N1—D3104 (2)
O1—S1—O4113.45 (6)D2—N1—D3110 (2)
O2—S1—O398.62 (5)D1—N1—D4110.0 (19)
O1—S1—O3106.37 (6)D2—N1—D4111.2 (19)
O4—S1—O3104.68 (5)D3—N1—D4109 (2)
O3i—O3—S1105.44 (9)
O2—S1—O3—O3i178.60 (10)O4—S1—O3—O3i59.42 (11)
O1—S1—O3—O3i60.96 (11)
Symmetry code: (i) x, y+2, z+1.

Experimental details

Crystal data
Chemical formula(SO4)2(NH4)2
Mr228.20
Crystal system, space groupMonoclinic, P21/n
Temperature (K)118
a, b, c (Å)6.1340 (2), 7.9324 (3), 7.7541 (3)
β (°) 94.966 (1)
V3)375.88 (2)
Z2
Radiation typeMo Kα
µ (mm1)0.73
Crystal size (mm)0.32 × 0.20 × 0.20
Data collection
DiffractometerNONIUS KappaCCD diffraktometer
diffractometer
Absorption correction
No. of measured, independent and
observed [I > 2σ(I)] reflections
1393, 791, 768
Rint0.024
(sin θ/λ)max1)0.658
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.028, 0.069, 1.07
No. of reflections791
No. of parameters71
H-atom treatmentRefined isotropic
Δρmax, Δρmin (e Å3)0.25, 0.30

Computer programs: Collect Package, BRUKER NONIUS B.V. 1999, SHELXS97, Sheldrick 1990, SHELXL97, Sheldrick 1997, SCHAKAL 99, Keller 1999.

 

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