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This article demonstrates the possibility to perform X-ray diffraction/scattering computed tomography experiments with a laboratory diffraction setup. This technique is useful to characterize samples with inhomogeneities on a length scale of a couple of hundred micrometres. Furthermore, the method can be applied to preliminary phase-selective imaging prior to higher-resolution characterization using synchrotron radiation. This article presents the results of test experiments carried out on a rhombohedral C60 sample previously studied at the ESRF.

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