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The poly­seleno title compound, bis(N,N-diethyl­seleno­carbamoyl) tri­selenide, [(Se2CNEt2)2Se] or C10H20N2Se5, is obtained from the disproportion of sodium N,N-diethyl-1,1-di­seleno­carbamate. An Se atom connects two N,N-diethyl-1,1-di­seleno­carbamate groups with Se-Se distances in the range 2.4500 (11)-2.8601 (12) Å

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108270100005497/qb0208sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108270100005497/qb0208Isup2.hkl
Contains datablock I

CCDC reference: 145657

Comment top

In sharp contrast to many studies on the chemistry of metal complexes with 1,1-dithiolate ligands, the chemistry of metal complexes with 1,1-diselenolate ligands has received scant attention. Although the 2,2-dicyanoethylence-1,1-diselenolate and N,N-diethyl-1,1-diselenocarbamate ligands were prepared many years ago (Jensen & Henriksen, 1970; Barnard et al., 1961), to our surprise, there are very few papers referring to such diselenolate ligands, among which the investigation was focused on the spectroscopic properties (Jensen & Krishnan, 1970), and very few crystal structures, such as bis(tetra-n-butylammonium) bis(2,2-dicyanoethylene-1,1-diselenolato)selenium(II) (Hummel et al., 1992) and selenium bis(1-pyrrolidinecarbodiselenoate) (Esperas et al., 1975), have been determined.

One of our current research interests is directed towards the understanding of transition metal complexes with seleno ligands (Hong et al., 1998; Cao et al., 1994). In an attempt to prepare organic ligands with polyselenide, we ran the oxidation of sodium N,N-diethyl-1,1-diselenocarbamate in MeOH and isolated an organic polyseleno compound ligand [{Se2CN(Et)2} 2Se], (I). The compound contains two N,N-diethyl-1,1-diselenocarbamate groups connected by an inorganic Se atom. If C1—Se1 and C6—Se3 are considered as double bonds, Se—Se—Se can be regarded as as a polyseleno center with an angle of 89.56 (4)°. The Se—Se distances in the range 2.4500 (11)–2.8601 (12) Å are comparible to those found in polyseleno compounds (Hummel et al., 1992; Esperas et al., 1975).

Experimental top

The title compound was obtained from the disproportion of sodium N,N-diethyl-1,1-diselenocarbamate in CH3OH. NaSe2CN(Et)2 (0.20 g, 0.75 mmol) was disolved in 30 ml of CH3OH in air. The reaction solution turned red gradually. After stirring for 5 h, the red solution was filtered. The filtrate was kept in an icebox for one day to yield crystalline product of the title complex. Red prism crystals suitable for X-ray diffraction analysis were obtained by recrystallization from THF/CH3OH at room temperature.

Computing details top

Data collection: SMART CCD Software (Siemens, 1994); cell refinement: SMART CCD Software; data reduction: SMART CCD Software; program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); software used to prepare material for publication: SHELXL97.

Bis(N,N-diethyl-1,1-diselenocarbamate)selenium top
Crystal data top
C10H20N2Se5F(000) = 1056
Mr = 563.08Dx = 2.167 Mg m3
Monoclinic, P21/nMo Kα radiation, λ = 0.71073 Å
a = 6.719 (1) ÅCell parameters from 456 reflections
b = 10.029 (2) Åθ = 8.3–19.6°
c = 25.615 (5) ŵ = 10.60 mm1
β = 90.65 (3)°T = 293 K
V = 1726.0 (5) Å3Prism, red
Z = 40.28 × 0.24 × 0.22 mm
Data collection top
Smart CCD
diffractometer
2901 independent reflections
Radiation source: fine-focus sealed tube2205 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.040
ω scansθmax = 25.0°, θmin = 1.6°
Absorption correction: empirical (using intensity measurements)
empirical (using intensity measurements) from equivalent reflections (XEMP in SHELXTL; Siemens, 1994)
h = 77
Tmin = 0.065, Tmax = 0.097k = 1111
5262 measured reflectionsl = 2130
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.048H-atom parameters constrained
wR(F2) = 0.113 w = 1/[σ2(Fo2) + (0.0564P)2]
where P = (Fo2 + 2Fc2)/3
S = 1.00(Δ/σ)max < 0.001
2901 reflectionsΔρmax = 0.74 e Å3
155 parametersΔρmin = 0.99 e Å3
0 restraintsExtinction correction: SHELXL97, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.0076 (5)
Crystal data top
C10H20N2Se5V = 1726.0 (5) Å3
Mr = 563.08Z = 4
Monoclinic, P21/nMo Kα radiation
a = 6.719 (1) ŵ = 10.60 mm1
b = 10.029 (2) ÅT = 293 K
c = 25.615 (5) Å0.28 × 0.24 × 0.22 mm
β = 90.65 (3)°
Data collection top
Smart CCD
diffractometer
2901 independent reflections
Absorption correction: empirical (using intensity measurements)
empirical (using intensity measurements) from equivalent reflections (XEMP in SHELXTL; Siemens, 1994)
2205 reflections with I > 2σ(I)
Tmin = 0.065, Tmax = 0.097Rint = 0.040
5262 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0480 restraints
wR(F2) = 0.113H-atom parameters constrained
S = 1.00Δρmax = 0.74 e Å3
2901 reflectionsΔρmin = 0.99 e Å3
155 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. The structure was solved by direct methods. All non-H atoms were refined with anisotropic displacement parameters. The positions of all hydrogen atoms were generated geometrically (C—H bond fixed at 0.96 Å), assigned isotropic thermal parameters, and allowed to ride on their respective parent C atoms before the final cycle of least-squares refinement. All calculations

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Se10.39112 (12)0.59694 (8)0.34056 (3)0.0526 (3)
Se20.06586 (11)0.68677 (7)0.34203 (3)0.0477 (2)
Se30.40455 (13)1.03773 (8)0.42985 (3)0.0591 (3)
Se40.05674 (12)0.98294 (7)0.41251 (3)0.0511 (3)
Se50.19784 (11)0.82449 (7)0.38426 (3)0.0430 (2)
N10.0761 (9)0.4639 (5)0.2893 (2)0.0409 (14)
N20.0992 (10)1.2146 (6)0.4548 (3)0.0568 (17)
C10.1316 (10)0.5650 (7)0.3194 (2)0.0393 (16)
C20.2204 (12)0.3667 (7)0.2699 (3)0.053 (2)
H2A0.34800.40940.26810.080*
H2B0.18340.33790.23530.080*
C30.2416 (16)0.2487 (9)0.3055 (4)0.089 (3)
H3A0.33870.18710.29270.080*
H3B0.28010.27770.33990.080*
H3C0.11420.20560.30690.080*
C40.1336 (12)0.4394 (7)0.2738 (3)0.0520 (19)
H4A0.21860.47460.30030.080*
H4B0.15720.34520.27140.080*
C50.1878 (13)0.5021 (9)0.2221 (3)0.073 (3)
H5A0.32480.48490.21360.080*
H5B0.16660.59660.22460.080*
H5C0.10460.46590.19540.080*
C60.1471 (11)1.0978 (7)0.4360 (2)0.0420 (17)
C70.1105 (12)1.2566 (8)0.4609 (3)0.061 (2)
H7A0.12271.31360.49080.080*
H7B0.19091.17880.46640.080*
C80.1869 (14)1.3315 (9)0.4129 (4)0.086 (3)
H8A0.32341.35730.41690.080*
H8B0.10661.40950.40780.080*
H8C0.17531.27370.38320.080*
C90.2550 (15)1.3239 (10)0.4647 (4)0.086 (3)
H9A0.20021.41070.45800.080*
H9B0.36601.31020.44210.080*
C100.3226 (19)1.3166 (11)0.5191 (5)0.112 (4)
H10A0.42231.38260.52670.080*
H10B0.21011.33030.54130.080*
H10C0.37671.22930.52520.080*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Se10.0444 (5)0.0572 (5)0.0562 (5)0.0075 (4)0.0019 (4)0.0103 (4)
Se20.0450 (5)0.0411 (4)0.0572 (5)0.0040 (3)0.0070 (4)0.0145 (3)
Se30.0515 (5)0.0583 (5)0.0672 (6)0.0038 (4)0.0123 (4)0.0153 (4)
Se40.0493 (5)0.0461 (5)0.0580 (5)0.0032 (4)0.0042 (4)0.0146 (4)
Se50.0524 (5)0.0415 (4)0.0351 (4)0.0004 (3)0.0027 (3)0.0052 (3)
N10.047 (4)0.043 (3)0.033 (3)0.001 (3)0.005 (3)0.007 (3)
N20.054 (4)0.049 (4)0.067 (4)0.005 (3)0.004 (3)0.019 (3)
C10.047 (4)0.040 (4)0.031 (3)0.003 (3)0.009 (3)0.002 (3)
C20.067 (5)0.047 (4)0.044 (4)0.017 (4)0.016 (4)0.010 (3)
C30.135 (10)0.063 (6)0.071 (6)0.044 (6)0.019 (6)0.011 (5)
C40.061 (5)0.045 (4)0.050 (4)0.007 (4)0.004 (4)0.006 (3)
C50.082 (7)0.076 (6)0.061 (6)0.010 (5)0.018 (5)0.002 (5)
C60.057 (5)0.038 (4)0.031 (3)0.000 (4)0.004 (3)0.002 (3)
C70.068 (6)0.049 (5)0.066 (6)0.009 (4)0.018 (5)0.014 (4)
C80.071 (7)0.075 (7)0.114 (9)0.020 (5)0.021 (6)0.023 (6)
C90.086 (8)0.095 (8)0.076 (7)0.007 (6)0.003 (6)0.020 (6)
C100.123 (10)0.111 (10)0.101 (9)0.014 (8)0.026 (8)0.023 (7)
Geometric parameters (Å, º) top
Se1—Se52.8601 (12)N1—C21.467 (8)
Se1—C11.848 (7)N1—C41.480 (9)
Se2—C11.898 (7)N2—C61.308 (9)
Se2—Se52.4847 (12)N2—C71.480 (10)
Se3—Se52.7981 (12)N2—C91.535 (11)
Se3—C61.840 (7)C2—C31.501 (11)
Se4—C61.883 (7)C4—C51.506 (10)
Se4—Se52.4500 (11)C7—C81.525 (12)
N1—C11.325 (8)C9—C101.462 (14)
C1—Se2—Se589.6 (2)N1—C1—Se2118.5 (5)
C6—Se4—Se589.1 (2)Se1—C1—Se2117.4 (4)
Se4—Se5—Se289.56 (4)N1—C2—C3112.1 (6)
C1—N1—C2121.6 (6)N1—C4—C5112.8 (7)
C1—N1—C4123.0 (6)N2—C6—Se3124.1 (6)
C2—N1—C4115.4 (6)N2—C6—Se4119.0 (6)
C6—N2—C7122.1 (7)Se3—C6—Se4116.9 (4)
C6—N2—C9122.0 (7)N2—C7—C8111.5 (7)
C7—N2—C9115.3 (6)C10—C9—N2109.0 (8)
N1—C1—Se1124.2 (5)

Experimental details

Crystal data
Chemical formulaC10H20N2Se5
Mr563.08
Crystal system, space groupMonoclinic, P21/n
Temperature (K)293
a, b, c (Å)6.719 (1), 10.029 (2), 25.615 (5)
β (°) 90.65 (3)
V3)1726.0 (5)
Z4
Radiation typeMo Kα
µ (mm1)10.60
Crystal size (mm)0.28 × 0.24 × 0.22
Data collection
DiffractometerSmart CCD
diffractometer
Absorption correctionEmpirical (using intensity measurements)
empirical (using intensity measurements) from equivalent reflections (XEMP in SHELXTL; Siemens, 1994)
Tmin, Tmax0.065, 0.097
No. of measured, independent and
observed [I > 2σ(I)] reflections
5262, 2901, 2205
Rint0.040
(sin θ/λ)max1)0.595
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.048, 0.113, 1.00
No. of reflections2901
No. of parameters155
H-atom treatmentH-atom parameters constrained
Δρmax, Δρmin (e Å3)0.74, 0.99

Computer programs: SMART CCD Software (Siemens, 1994), SMART CCD Software, SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), SHELXL97.

Selected geometric parameters (Å, º) top
Se1—Se52.8601 (12)Se3—Se52.7981 (12)
Se1—C11.848 (7)Se3—C61.840 (7)
Se2—C11.898 (7)Se4—C61.883 (7)
Se2—Se52.4847 (12)Se4—Se52.4500 (11)
C1—Se2—Se589.6 (2)Se1—C1—Se2117.4 (4)
C6—Se4—Se589.1 (2)N2—C6—Se3124.1 (6)
Se4—Se5—Se289.56 (4)N2—C6—Se4119.0 (6)
N1—C1—Se2118.5 (5)Se3—C6—Se4116.9 (4)
 

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