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The title compound, 2C6H7ClN+·I-·I3-, crystallizes with undulating layers of chains containing alternate iodide and triiodide anions formed from iodine and the heterocyclic iodide salt.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108270100017315/qa0458sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108270100017315/qa0458Isup2.hkl
Contains datablock I

CCDC reference: 156225

Comment top

Pyridine–iodine compounds are often an interesting starting point for studies of donor–acceptor complexes and salts (Zingaro et al., 1951; Kleinberg et al., 1953; Reid & Mulliken, 1954). N-Alkyl-substituted pyridines lose the possibility to coordinate through the nitrogen centre and, therefore, the reaction of 2-chloro-N-methylpyridinium iodide with iodine leads to a new iodide salt of a pyridine. The resulting product is a mixed iodide triiodide, (I). \scheme

Many crystal structures of pyridinium as well as triiodide salts are registered in the Crystal Structural Database (Allen & Kennard, 1993), but only 24 structures containing iodide triiodide are known previously. The structure of (I) exhibits a nearly linear triiodide with similar distances I—I of 2.921 (1) and 2.945 (1) Å, and an angle I—I—I of 177.06 (1)°. The I4 atoms with distances I4···I3i = 4.260 (1) Å as well as I4···I2ii = 4.103 (1) Å and angles I4···I3i—I1i = 161.68 (2)° as well as I4···I2ii—I1ii = 162.56 (2)° are arranged in undulating chains of alternate iodide and triiodide anions along the b axis, which are generated by a 21 screw axis [symmetry codes: (i) 1 + x, 1/2 − y, −1/2 + z; (ii) −x, −y, −1 − z]. These parallel chains form layers separated by 2-chloro-N-methylpyridinium cations exhibiting bonds and angles similar to those in the salts N-methylpyridinium iodide (Lalancette et al., 1978) and N-ethylpyridinium triiodide (Christie et al., 1991). The chlorine substituent in (I) shows an additional weak coordination to the triiodide anion with distances Cl2···I1 = 3.889 (2) and Cl2···I2 = 3.637 (2) Å.

Experimental top

A solution of 2-chloro-N-methylpyridinium iodide (0.128 g, 0.5 mmol) in 50 ml trichloromethane was covered with a filter and a solution of iodide (0.5 mM) in n-pentane added from above. After 10 d, dark-red prisms had grown.

Refinement top

All H atom were located from the difference map and placed in idealized positions using a riding model with distances C—Hphenyl = 0.95 Å and C—Hmethyl = 0.98 Å. The torsion of the methyl H atoms and the isotropic displacement parameters of all H atoms were refined.

Computing details top

Data collection: XSCANS (Siemens, 1994); cell refinement: XSCANS; data reduction: XSCANS; program(s) used to solve structure: SHELXS97 (Sheldrick, 1990); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); software used to prepare material for publication: SHELXL97.

(I) top
Crystal data top
2C6H7ClN+·I·I3F(000) = 1384
Mr = 764.75Dx = 2.556 Mg m3
Monoclinic, P21/cMo Kα radiation, λ = 0.71073 Å
a = 7.2902 (7) ÅCell parameters from 84 reflections
b = 23.644 (2) Åθ = 10–15.5°
c = 12.0207 (9) ŵ = 6.53 mm1
β = 106.448 (6)°T = 150 K
V = 1987.2 (3) Å3Prism, red
Z = 40.35 × 0.20 × 0.15 mm
Data collection top
Siemens P4 four-circle
diffractometer
4004 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.030
Graphite monochromatorθmax = 28.0°, θmin = 2.0°
ω scansh = 29
Absorption correction: numerical
(SHELXTL/PC; Sheldrick, 1997)
k = 231
Tmin = 0.300, Tmax = 0.474l = 1515
7177 measured reflections4 standard reflections every 100 reflections
4780 independent reflections intensity decay: <5%
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.036H-atom parameters constrained
wR(F2) = 0.085 w = 1/[σ2(Fo2) + (0.0342P)2 + 9.6004P]
where P = (Fo2 + 2Fc2)/3
S = 1.10(Δ/σ)max < 0.001
4780 reflectionsΔρmax = 0.87 e Å3
184 parametersΔρmin = 1.41 e Å3
0 restraintsExtinction correction: SHELXL97, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.00156 (11)
Crystal data top
2C6H7ClN+·I·I3V = 1987.2 (3) Å3
Mr = 764.75Z = 4
Monoclinic, P21/cMo Kα radiation
a = 7.2902 (7) ŵ = 6.53 mm1
b = 23.644 (2) ÅT = 150 K
c = 12.0207 (9) Å0.35 × 0.20 × 0.15 mm
β = 106.448 (6)°
Data collection top
Siemens P4 four-circle
diffractometer
4004 reflections with I > 2σ(I)
Absorption correction: numerical
(SHELXTL/PC; Sheldrick, 1997)
Rint = 0.030
Tmin = 0.300, Tmax = 0.4744 standard reflections every 100 reflections
7177 measured reflections intensity decay: <5%
4780 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0360 restraints
wR(F2) = 0.085H-atom parameters constrained
S = 1.10Δρmax = 0.87 e Å3
4780 reflectionsΔρmin = 1.41 e Å3
184 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
I10.35210 (5)0.066901 (16)0.22275 (3)0.02481 (10)
I20.16630 (6)0.037187 (17)0.26476 (3)0.02855 (11)
I30.52092 (6)0.174936 (17)0.17959 (3)0.02922 (11)
I40.07353 (5)0.200539 (18)0.64954 (3)0.02882 (11)
Cl10.2811 (3)0.04391 (7)0.57694 (16)0.0424 (4)
N10.0928 (7)0.1221 (2)0.4354 (4)0.0255 (10)
C10.2611 (9)0.1075 (2)0.5079 (5)0.0246 (11)
C20.4185 (8)0.1420 (3)0.5281 (5)0.0272 (12)
H20.53700.13080.58020.033*
C30.4015 (9)0.1929 (3)0.4717 (5)0.0298 (13)
H30.50840.21750.48370.036*
C40.2277 (9)0.2078 (3)0.3976 (5)0.0296 (13)
H40.21400.24310.35830.036*
C50.0755 (9)0.1726 (3)0.3800 (5)0.0311 (13)
H50.04420.18340.32860.037*
C70.0819 (9)0.0855 (3)0.4150 (6)0.0297 (13)
H7A0.18510.10150.35190.045*
H7B0.12270.08380.48590.045*
H7C0.05210.04730.39380.045*
Cl20.1897 (2)0.04991 (7)0.06470 (14)0.0337 (3)
N20.2448 (7)0.1430 (2)0.0586 (4)0.0223 (9)
C110.3278 (8)0.0956 (3)0.0337 (5)0.0253 (11)
C120.5177 (8)0.0842 (3)0.0852 (5)0.0277 (12)
H120.57460.05060.06700.033*
C130.6240 (9)0.1225 (3)0.1637 (5)0.0305 (13)
H130.75550.11550.20060.037*
C140.5388 (9)0.1710 (3)0.1883 (5)0.0280 (12)
H140.61140.19800.24140.034*
C150.3496 (9)0.1800 (2)0.1361 (5)0.0249 (11)
H150.29020.21310.15450.030*
C170.0397 (9)0.1547 (3)0.0053 (6)0.0360 (14)
H17A0.03710.12560.02900.054*
H17B0.01230.15450.07940.054*
H17C0.00790.19190.03080.054*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
I10.02228 (18)0.0283 (2)0.02338 (17)0.00284 (14)0.00572 (13)0.00223 (14)
I20.0298 (2)0.0279 (2)0.03022 (19)0.00124 (15)0.01224 (15)0.00025 (15)
I30.0339 (2)0.0247 (2)0.0304 (2)0.00222 (16)0.01135 (16)0.00251 (15)
I40.02156 (18)0.0345 (2)0.02962 (19)0.00192 (16)0.00597 (14)0.00466 (16)
Cl10.0483 (10)0.0292 (8)0.0450 (9)0.0060 (7)0.0054 (8)0.0087 (7)
N10.026 (2)0.027 (2)0.025 (2)0.000 (2)0.0103 (19)0.0027 (19)
C10.031 (3)0.022 (3)0.022 (2)0.001 (2)0.008 (2)0.000 (2)
C20.025 (3)0.031 (3)0.024 (3)0.003 (2)0.003 (2)0.001 (2)
C30.029 (3)0.028 (3)0.036 (3)0.009 (2)0.015 (2)0.000 (2)
C40.033 (3)0.025 (3)0.033 (3)0.001 (2)0.012 (3)0.004 (2)
C50.027 (3)0.036 (3)0.029 (3)0.001 (3)0.006 (2)0.003 (3)
C70.035 (3)0.021 (3)0.038 (3)0.007 (2)0.018 (3)0.007 (2)
Cl20.0322 (7)0.0300 (7)0.0361 (8)0.0025 (6)0.0049 (6)0.0097 (6)
N20.020 (2)0.025 (2)0.023 (2)0.0005 (19)0.0072 (18)0.0047 (19)
C110.028 (3)0.024 (3)0.025 (3)0.004 (2)0.009 (2)0.001 (2)
C120.024 (3)0.024 (3)0.037 (3)0.000 (2)0.012 (2)0.003 (2)
C130.025 (3)0.039 (3)0.028 (3)0.004 (3)0.008 (2)0.007 (3)
C140.031 (3)0.030 (3)0.025 (3)0.011 (2)0.010 (2)0.005 (2)
C150.031 (3)0.017 (3)0.030 (3)0.008 (2)0.015 (2)0.001 (2)
C170.025 (3)0.035 (3)0.045 (4)0.006 (3)0.005 (3)0.002 (3)
Geometric parameters (Å, º) top
I1—I22.9213 (6)C4—C51.355 (9)
I1—I32.9446 (6)Cl2—C111.704 (6)
Cl1—C11.704 (6)N2—C151.347 (7)
N1—C11.334 (8)N2—C111.347 (8)
N1—C51.356 (8)N2—C171.477 (7)
N1—C71.501 (7)C11—C121.373 (8)
C1—C21.372 (8)C12—C131.377 (9)
C2—C31.369 (9)C13—C141.375 (9)
C3—C41.374 (9)C14—C151.361 (9)
I2—I1—I3177.055 (18)C15—N2—C11119.5 (5)
C1—N1—C5119.3 (5)C15—N2—C17118.9 (5)
C1—N1—C7122.6 (5)C11—N2—C17121.5 (5)
C5—N1—C7118.1 (5)N2—C11—C12121.4 (5)
N1—C1—C2122.1 (5)N2—C11—Cl2117.8 (4)
N1—C1—Cl1118.8 (5)C12—C11—Cl2120.8 (5)
C2—C1—Cl1119.1 (5)C11—C12—C13118.7 (6)
C3—C2—C1118.7 (6)C14—C13—C12119.6 (6)
C2—C3—C4119.0 (6)C15—C14—C13119.5 (6)
C5—C4—C3120.5 (6)N2—C15—C14121.2 (6)
C4—C5—N1120.4 (6)
C5—N1—C1—C20.3 (9)C15—N2—C11—C120.4 (8)
C7—N1—C1—C2178.3 (5)C17—N2—C11—C12178.7 (6)
C5—N1—C1—Cl1180.0 (4)C15—N2—C11—Cl2180.0 (4)
C7—N1—C1—Cl12.0 (7)C17—N2—C11—Cl21.7 (7)
N1—C1—C2—C30.1 (9)N2—C11—C12—C130.1 (9)
Cl1—C1—C2—C3179.6 (5)Cl2—C11—C12—C13179.6 (4)
C1—C2—C3—C40.4 (9)C11—C12—C13—C140.2 (9)
C2—C3—C4—C50.3 (9)C12—C13—C14—C151.0 (9)
C3—C4—C5—N10.1 (10)C11—N2—C15—C141.1 (8)
C1—N1—C5—C40.4 (9)C17—N2—C15—C14179.5 (5)
C7—N1—C5—C4178.4 (6)C13—C14—C15—N21.5 (9)

Experimental details

Crystal data
Chemical formula2C6H7ClN+·I·I3
Mr764.75
Crystal system, space groupMonoclinic, P21/c
Temperature (K)150
a, b, c (Å)7.2902 (7), 23.644 (2), 12.0207 (9)
β (°) 106.448 (6)
V3)1987.2 (3)
Z4
Radiation typeMo Kα
µ (mm1)6.53
Crystal size (mm)0.35 × 0.20 × 0.15
Data collection
DiffractometerSiemens P4 four-circle
diffractometer
Absorption correctionNumerical
(SHELXTL/PC; Sheldrick, 1997)
Tmin, Tmax0.300, 0.474
No. of measured, independent and
observed [I > 2σ(I)] reflections
7177, 4780, 4004
Rint0.030
(sin θ/λ)max1)0.661
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.036, 0.085, 1.10
No. of reflections4780
No. of parameters184
H-atom treatmentH-atom parameters constrained
Δρmax, Δρmin (e Å3)0.87, 1.41

Computer programs: XSCANS (Siemens, 1994), XSCANS, SHELXS97 (Sheldrick, 1990), SHELXL97 (Sheldrick, 1997), SHELXL97.

Selected geometric parameters (Å, º) top
I1—I22.9213 (6)N1—C71.501 (7)
I1—I32.9446 (6)Cl2—C111.704 (6)
Cl1—C11.704 (6)N2—C151.347 (7)
N1—C11.334 (8)N2—C111.347 (8)
N1—C51.356 (8)N2—C171.477 (7)
I2—I1—I3177.055 (18)C2—C1—Cl1119.1 (5)
C1—N1—C5119.3 (5)C15—N2—C17118.9 (5)
C1—N1—C7122.6 (5)C11—N2—C17121.5 (5)
C5—N1—C7118.1 (5)N2—C11—Cl2117.8 (4)
N1—C1—Cl1118.8 (5)C12—C11—Cl2120.8 (5)
 

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