Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
The diffraction line broadening due to lattice-parameter variations caused by a position-dependent (spatial) scalar variable (e.g. the composition) was analysed theoretically. It was shown that the anisotropy of the resulting microstrain-like line broadening depends on the symmetry of the crystal system of the phase concerned. This model provides a physical basis for a special case of a previously reported phenomenological description of anisotropic microstrain broadening [Stephens (1999). J. Appl. Cryst. 32, 281–289], which is widely used in Rietveld refinement. The model presented was used to analyse the hkl dependence of the X-ray diffraction line broadening of a sample of hexagonal [epsilon]-iron nitride, FeNy0 with the average N content y0 = 0.433. The observed anisotropy of the line broadening was shown to be compatible with the known composition dependencies of the lattice parameters a(y) and c(y). From the extent of the line broadening, the standard deviation of y0 could be determined very well, as 0.008.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
   HTML (US $40)
   PDF+HTML (US $50)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds