Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
In 1987, Rius, Plana & Palanques [J. Appl. Cryst. (1987), 20, 457-460] devised an X-ray powder diffraction method based on the `least-squares' determination of calibration constants using only the diffracted intensities and the calculated absorption coefficients of the components. This method was developed for `infinitely thick' samples, a condition which is seldom met by airborne particulates because of the small amount of material normally available. Since the analysis of such samples may become one of the principal applications of the method, this condition represents a serious limitation. The simplest way to overcome this limitation is by correcting the measured intensities. This can be done either by direct measurement of the sample transmission, or alternatively, by using refined transmission values. In the latter case no experimental values are necessary. With the help of some test calculations, the viability of both possibilities has been explored.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
   HTML (US $40)
   PDF+HTML (US $50)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds