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The CeB6(001) single crystal used as a cathode in a low-emittance electron gun and operated at the free-electron laser facility SACLA was investigated using cathode lens electron microscopy combined with X-ray spectroscopy at SPring-8 synchrotron radiation facility. Multilateral analysis using thermionic emission electron microscopy, low-energy electron microscopy, ultraviolet and X-ray photoemission electron microscopy and hard X-ray photoemission spectroscopy revealed that the thermionic electrons are emitted strongly and evenly from the CeB6 surface after pre-activation treatment (annealing at 1500°C for >1 h) and that the thermionic emission intensity as well as elemental composition vary between the central area and the edge of the old CeB6 surface.

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Portable Document Format (PDF) file https://doi.org/10.1107/S1600577521009656/ok5053sup1.pdf
SM1,2. Full profile of LEEM, UV-PEEM and TEEM images of used CeB6 along 0° (SM1) and 45° (SM2) direction. SM3. E_STV-dependent UV-PEEM images of pristine and used CeB6.


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