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The crystal structure of zirconium oxide nanoparticles was refined by the Rietveld analysis of synchrotron X-ray powder diffraction data measured at 298 K. In the nanoparticles, two phases of tetragonal ZrO2 − δ (average particle size: 11 ± 2 nm) and monoclinic ZrO2 (average particle size: 24 ± 4 nm) existed, where the weight fractions were estimated to be 84.9 and 15.1 wt%, respectively. The structural refinement suggests that the tetragonal ZrO2 − δ has an oxygen deficiency [δ = 0.031 (7)] and that the monoclinic ZrO2 − δ has less oxygen deficiency (δ ≃ 0), where δ is the vacancy concentration. The monoclinic ZrO2 has a larger unit-cell volume. The maximum-entropy method analysis indicated covalent bonding between Zr and O atoms.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768105030570/og5013sup1.cif
Contains datablocks global, I, VICS_phase_1

rtv

Rietveld powder data file (CIF format) https://doi.org/10.1107/S0108768105030570/og5013Isup2.rtv
Contains datablock I

txt

Text file https://doi.org/10.1107/S0108768105030570/og5013sup3.txt
Pattern fitting structure data

Experimental top

Precursor sols were prepared from a mixture of 70 wt% zirconium (IV) propoxide 1-propanol solution and 98 wt% triethanolamine. The sols were hydrolyzed with half volume of water in a Teflon-lined autoclave at 110 oC for 24 h and then at 120 oC for 120 h. A white fine powder was separated from the mother solution by a centrifuge and rinsed several times with ethanol. In order to obtain zirconium oxide nanocrystallites, the ethanol sol was dried in air on a quartz plate at 125 oC for 22 h(Tsunekawa et al., 2005b).

Refinement top

The crystal structure of the zirconium oxide nanocrystallites was refined by the Rietveld method with a computer program RIETAN-2000 (Izumi & Ikeda, 2000).

Computing details top

Data collection: RIGAKU software (Toraya et al., 1996) for (I). Cell refinement: RIETAN-2000 (Izumi and Ikeda, 2000) for (I). Program(s) used to solve structure: RIETAN-2000 for (I). Program(s) used to refine structure: RIETAN-2000 for (I). Molecular graphics: VENUS [Izumi and Dilanian (2002)] for (I).

Figures top
[Figure 1] Fig. 1. Rietveld refinement of the synchrotron X-ray powder diffraction data of the zirconium oxide nanoparticles. Magnified view of the peak profile in the 2 range from 80 to 140 °. is inserted. Red points and green line denote the observed and calculated intensities, respectively. The difference between the observed and calculated intensities is drawn by a blue line below the profile. Up and down green short verticals denote the calculated peak positions of the monoclinic and tetragonal phases, respectively.
[Figure 2] Fig. 2. (A) Refined crystal structure and equi-electron-density surfaces (B) at 10 and (C) at 1 ?-3 of the tetragonal zirconium oxide nanoparticles. Two bond lengths between the cation and anion are R = 2.3562 (6) ? and r = 2.0805 (5) ?. Arrows stand for the displacements of oxygen atoms along the c axis (0.237 (1) ?).
(I) zirconium oxide top
Crystal data top
O2xZrDx = 6.159 Mg m3
Mr = 246.49Monochromatized synchrotron X-ray 1.20200 radiation, λ = 1.20200 Å
Tetragonal, P42/nmcT = 298 K
a = 3.58651 (8) ÅParticle morphology: plate-like
c = 5.16658 (15) Åwhite
V = 66.46 (1) Å3flat sheet, 12 × 12 mm
Z = 2Specimen preparation: Prepared at 398 K
F(000) = 111.192
Data collection top
A multiple-detector system with Ge(111) analyzer crystals, Soller slits and scintillation counters (Toraya et al., 1996)
diffractometer
Data collection mode: reflection
Radiation source: synchrotron X-rayScan method: step
Ge(111) analyzer crystals monochromator2θmin = 10.501°, 2θmax = 154.808°, 2θstep = 0.01°
Specimen mounting: packed powder pellet
Refinement top
Rp = 0.047Profile function: a split-type Pearson VII (Toraya, 1990)
Rwp = 0.06157 (13 for structural parameters) parameters
Rexp = 0.063
RBragg = 0.009Background function: twelve-parameter polynomial in 2thetan, where n has values between 0 and 11
χ2 = 1.690Preferred orientation correction: no
14432 data points
Crystal data top
O2xZrV = 66.46 (1) Å3
Mr = 246.49Z = 2
Tetragonal, P42/nmcMonochromatized synchrotron X-ray 1.20200 radiation, λ = 1.20200 Å
a = 3.58651 (8) ÅT = 298 K
c = 5.16658 (15) Åflat sheet, 12 × 12 mm
Data collection top
A multiple-detector system with Ge(111) analyzer crystals, Soller slits and scintillation counters (Toraya et al., 1996)
diffractometer
Scan method: step
Specimen mounting: packed powder pellet2θmin = 10.501°, 2θmax = 154.808°, 2θstep = 0.01°
Data collection mode: reflection
Refinement top
Rp = 0.047χ2 = 1.690
Rwp = 0.06114432 data points
Rexp = 0.06357 (13 for structural parameters) parameters
RBragg = 0.009
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
Zr0.994Hf0.0060000.385 (1)*
O00.50.2042 (2)0.934 (17)*0.984 (4)
Bond lengths (Å) top
M—O2.3562 (6)M—O2.0805 (5)
(VICS_phase_1) top
Crystal data top
?β = 90°
Mr = ?γ = 90°
?, P42/nmcV = ? Å3
a = 3.58651 (8) ÅZ = ?
b = 3.58651 (8) Å? radiation, λ = ? Å
c = 5.16658 (8) Å × × mm
α = 90°
Data collection top
h = ??l = ??
k = ??
Refinement top
Crystal data top
?β = 90°
Mr = ?γ = 90°
?, P42/nmcV = ? Å3
a = 3.58651 (8) ÅZ = ?
b = 3.58651 (8) Å? radiation, λ = ? Å
c = 5.16658 (8) Å × × mm
α = 90°
Data collection top
Refinement top
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzBiso*/BeqOcc. (<1)
Zr0000.385 (1)*
O00.500000.2041 (3)0.934 (17)*0.984 (4)

Experimental details

(I)(VICS_phase_1)
Crystal data
Chemical formulaO2xZr?
Mr246.49?
Crystal system, space groupTetragonal, P42/nmc?, P42/nmc
Temperature (K)298?
a, c (Å)3.58651 (8), 5.16658 (15)3.58651 (8), 5.16658 (8)
V3)66.46 (1)?
Z2?
Radiation typeMonochromatized synchrotron X-ray 1.20200, λ = 1.20200 Å?, λ = ? Å
µ (mm1)?
Specimen shape, size (mm)Flat sheet, 12 × 12 × ×
Data collection
DiffractometerA multiple-detector system with Ge(111) analyzer crystals, Soller slits and scintillation counters (Toraya et al., 1996)
diffractometer
?
Specimen mountingPacked powder pellet
Data collection modeReflection
Data collection methodStep?
Absorption correction?
No. of measured, independent and
observed reflections
?, ?, ?
Rint?
θ values (°)2θmin = 10.501 2θmax = 154.808 2θstep = 0.01θmax = ?
Refinement
R factors and goodness of fitRp = 0.047, Rwp = 0.061, Rexp = 0.063, RBragg = 0.009, χ2 = 1.690R[F2 > 2σ(F2)] = ?, wR(F2) = ?, S = ?
No. of reflections/data points14432?
No. of parameters57 (13 for structural parameters)?
No. of restraints??
Δρmax, Δρmin (e Å3)?, ?

Computer programs: RIGAKU software (Toraya et al., 1996), RIETAN-2000 (Izumi and Ikeda, 2000), RIETAN-2000, VENUS [Izumi and Dilanian (2002)].

Selected bond lengths (Å) for (I) top
M—O2.3562 (6)M—O2.0805 (5)
 

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