Supporting information
Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536801009771/ob6045sup1.cif | |
Structure factor file (CIF format) https://doi.org/10.1107/S1600536801009771/ob6045Isup2.hkl |
CCDC reference: 170770
Key indicators
- Single-crystal X-ray study
- T = 297 K
- Mean (C-C) = 0.003 Å
- R factor = 0.052
- wR factor = 0.149
- Data-to-parameter ratio = 28.5
checkCIF results
No syntax errors found
ADDSYM reports no extra symmetry
Alert Level C:
REFLT_03 From the CIF: _diffrn_reflns_theta_max 32.91 From the CIF: _reflns_number_total 1453 TEST2: Reflns within _diffrn_reflns_theta_max Count of symmetry unique reflns 1569 Completeness (_total/calc) 92.61% Alert C: < 95% complete PLAT_731 Alert C Bond Calc 0.86(5), Rep 0.86(2) .... 2.50 s.u-Ratio O1 -H1 1.555 1.555 PLAT_735 Alert C D-H Calc 0.86(5), Rep 0.86(2) .... 2.50 s.u-Ratio O1 -H1 1.555 1.555
0 Alert Level A = Potentially serious problem
0 Alert Level B = Potential problem
3 Alert Level C = Please check
The title compound was prepared by the reaction of an ethanol solution of piperazine and HCl (37% in water) the the molar ratio 1:2.5 at room temperature. Crystals of (I) were obtained by slow evaporation of the solution.
The H atom of the water molecule was located from a difference Fourier map and were refined with a fixed isotropic displacement parameter and a restrained bond distance of 0.85 Å, whereas the other H atoms were constrained to idealized geometries using the approperiate ridding model.
Data collection: SMART (Siemens, 1995); cell refinement: SAINT (Siemens, 1995); data reduction: SAINT and SADABS (Sheldrick, 1996); program(s) used to solve structure: SHELXTL (Bruker, 1997); program(s) used to refine structure: SHELXTL; molecular graphics: DIAMOND (Brandenburg, 2000).
C4H12N22+·2Cl−·H2O | F(000) = 376 |
Mr = 177.07 | Dx = 1.408 Mg m−3 |
Monoclinic, C2/c | Mo Kα radiation, λ = 0.71073 Å |
a = 10.2233 (3) Å | Cell parameters from 1781 reflections |
b = 6.3323 (3) Å | θ = 1–32° |
c = 13.5389 (6) Å | µ = 0.71 mm−1 |
β = 107.587 (2)° | T = 297 K |
V = 835.50 (6) Å3 | Thin plate, colorless |
Z = 4 | 0.40 × 0.20 × 0.04 mm |
Siemens SMART CCD diffractometer | 1453 independent reflections |
Radiation source: fine-focus sealed tube | 974 reflections with I > 2σ(I) |
Graphite monochromator | Rint = 0.043 |
Detector resolution: no pixels mm-1 | θmax = 32.9°, θmin = 3.2° |
ω scans | h = −8→15 |
Absorption correction: multi-scan (Sheldrick, 1996) | k = −8→9 |
Tmin = 0.764, Tmax = 0.972 | l = −20→20 |
3545 measured reflections |
Refinement on F2 | Primary atom site location: structure-invariant direct methods |
Least-squares matrix: full | Secondary atom site location: difference Fourier map |
R[F2 > 2σ(F2)] = 0.052 | Hydrogen site location: inferred from neighbouring sites |
wR(F2) = 0.149 | H atoms treated by a mixture of independent and constrained refinement |
S = 1.02 | w = 1/[σ2(Fo2) + (0.0792P)2] where P = (Fo2 + 2Fc2)/3 |
1453 reflections | (Δ/σ)max = 0.001 |
51 parameters | Δρmax = 0.48 e Å−3 |
1 restraint | Δρmin = −0.35 e Å−3 |
C4H12N22+·2Cl−·H2O | V = 835.50 (6) Å3 |
Mr = 177.07 | Z = 4 |
Monoclinic, C2/c | Mo Kα radiation |
a = 10.2233 (3) Å | µ = 0.71 mm−1 |
b = 6.3323 (3) Å | T = 297 K |
c = 13.5389 (6) Å | 0.40 × 0.20 × 0.04 mm |
β = 107.587 (2)° |
Siemens SMART CCD diffractometer | 1453 independent reflections |
Absorption correction: multi-scan (Sheldrick, 1996) | 974 reflections with I > 2σ(I) |
Tmin = 0.764, Tmax = 0.972 | Rint = 0.043 |
3545 measured reflections |
R[F2 > 2σ(F2)] = 0.052 | 1 restraint |
wR(F2) = 0.149 | H atoms treated by a mixture of independent and constrained refinement |
S = 1.02 | Δρmax = 0.48 e Å−3 |
1453 reflections | Δρmin = −0.35 e Å−3 |
51 parameters |
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes. |
Refinement. Data were collected using a Siemens SMART CCD diffractometer at 297 K. A full sphere of reciprocal space was scanned by 0.3° steps in ω with a crystal–to–detector distance of 3.97 cm. Preliminary orientation matrices were obtained from the first 100 frames using SMART (Siemens, 1995). The collected frames were integrated using the preliminary orientation matrix which was updated every 100 frames·Final cell parameters were obtained by refinement on the position of 1781 reflections with I>10σ(I) after integration of all the frames data using SAINT (Siemens, 1995). The data were empirically corrected for absorption and other effects using SADABS (Sheldrick, 1996). Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. |
x | y | z | Uiso*/Ueq | ||
Cl1 | 0.79885 (6) | 0.09493 (10) | 0.66349 (4) | 0.0422 (2) | |
N1 | 0.55069 (18) | 0.4113 (3) | 0.60246 (13) | 0.0316 (4) | |
H1A | 0.4929 | 0.4679 | 0.6338 | 0.040 (7)* | |
H1B | 0.6105 | 0.3283 | 0.6486 | 0.055 (8)* | |
C1 | 0.4714 (2) | 0.2815 (3) | 0.51244 (16) | 0.0348 (5) | |
H1C | 0.4202 | 0.1738 | 0.5360 | 0.048 (7)* | |
H1D | 0.5344 | 0.2112 | 0.4821 | 0.049 (8)* | |
O1 | 0.5000 | 0.0430 (6) | 0.7500 | 0.0731 (9) | |
C2 | 0.6266 (2) | 0.5831 (3) | 0.56860 (17) | 0.0346 (5) | |
H2A | 0.6947 | 0.5223 | 0.5402 | 0.029 (6)* | |
H2B | 0.6741 | 0.6695 | 0.6277 | 0.048 (7)* | |
H1 | 0.434 (4) | −0.035 (7) | 0.757 (5) | 0.150* |
U11 | U22 | U33 | U12 | U13 | U23 | |
Cl1 | 0.0371 (3) | 0.0526 (4) | 0.0370 (3) | 0.0167 (2) | 0.0113 (2) | 0.0009 (2) |
N1 | 0.0271 (8) | 0.0362 (9) | 0.0316 (8) | 0.0039 (7) | 0.0090 (6) | 0.0020 (7) |
C1 | 0.0365 (11) | 0.0269 (10) | 0.0425 (11) | −0.0020 (8) | 0.0143 (9) | −0.0024 (8) |
O1 | 0.055 (2) | 0.0586 (19) | 0.112 (3) | 0.000 | 0.035 (2) | 0.000 |
C2 | 0.0259 (10) | 0.0397 (11) | 0.0372 (10) | −0.0046 (8) | 0.0078 (8) | −0.0061 (9) |
N1—C2 | 1.487 (3) | C1—H1D | 0.9700 |
N1—C1 | 1.491 (3) | O1—H1 | 0.86 (2) |
N1—H1A | 0.9000 | C2—C1i | 1.510 (3) |
N1—H1B | 0.9000 | C2—H2A | 0.9700 |
C1—C2i | 1.510 (3) | C2—H2B | 0.9700 |
C1—H1C | 0.9700 | ||
C2—N1—C1 | 110.92 (16) | C2i—C1—H1D | 109.4 |
C2—N1—H1A | 109.5 | H1C—C1—H1D | 108.0 |
C1—N1—H1A | 109.5 | N1—C2—C1i | 110.23 (17) |
C2—N1—H1B | 109.5 | N1—C2—H2A | 109.6 |
C1—N1—H1B | 109.5 | C1i—C2—H2A | 109.6 |
H1A—N1—H1B | 108.0 | N1—C2—H2B | 109.6 |
N1—C1—C2i | 111.01 (17) | C1i—C2—H2B | 109.6 |
N1—C1—H1C | 109.4 | H2A—C2—H2B | 108.1 |
C2i—C1—H1C | 109.4 | H1—O1—H1ii | 109 (7) |
N1—C1—H1D | 109.4 |
Symmetry codes: (i) −x+1, −y+1, −z+1; (ii) −x+1, y, −z+3/2. |
D—H···A | D—H | H···A | D···A | D—H···A |
N1—H1B···Cl1 | 0.90 | 2.39 | 3.1412 (19) | 141 |
N1—H1A···Cl1iii | 0.90 | 2.29 | 3.1541 (18) | 162 |
O1—H1···Cl1iv | 0.86 (2) | 2.82 (4) | 3.492 (3) | 137 (5) |
C2—H2B···Cl1v | 0.97 | 2.80 | 3.475 (2) | 128 |
Symmetry codes: (iii) x−1/2, y+1/2, z; (iv) x−1/2, y−1/2, z; (v) −x+3/2, y+1/2, −z+3/2. |
Experimental details
Crystal data | |
Chemical formula | C4H12N22+·2Cl−·H2O |
Mr | 177.07 |
Crystal system, space group | Monoclinic, C2/c |
Temperature (K) | 297 |
a, b, c (Å) | 10.2233 (3), 6.3323 (3), 13.5389 (6) |
β (°) | 107.587 (2) |
V (Å3) | 835.50 (6) |
Z | 4 |
Radiation type | Mo Kα |
µ (mm−1) | 0.71 |
Crystal size (mm) | 0.40 × 0.20 × 0.04 |
Data collection | |
Diffractometer | Siemens SMART CCD diffractometer |
Absorption correction | Multi-scan (Sheldrick, 1996) |
Tmin, Tmax | 0.764, 0.972 |
No. of measured, independent and observed [I > 2σ(I)] reflections | 3545, 1453, 974 |
Rint | 0.043 |
(sin θ/λ)max (Å−1) | 0.764 |
Refinement | |
R[F2 > 2σ(F2)], wR(F2), S | 0.052, 0.149, 1.02 |
No. of reflections | 1453 |
No. of parameters | 51 |
No. of restraints | 1 |
H-atom treatment | H atoms treated by a mixture of independent and constrained refinement |
Δρmax, Δρmin (e Å−3) | 0.48, −0.35 |
Computer programs: SMART (Siemens, 1995), SAINT (Siemens, 1995), SAINT and SADABS (Sheldrick, 1996), SHELXTL (Bruker, 1997), SHELXTL, DIAMOND (Brandenburg, 2000).
N1—C2 | 1.487 (3) | C1—C2i | 1.510 (3) |
N1—C1 | 1.491 (3) | ||
C2—N1—C1 | 110.92 (16) | N1—C2—C1i | 110.23 (17) |
N1—C1—C2i | 111.01 (17) |
Symmetry code: (i) −x+1, −y+1, −z+1. |
D—H···A | D—H | H···A | D···A | D—H···A |
N1—H1B···Cl1 | 0.90 | 2.39 | 3.1412 (19) | 141.4 |
N1—H1A···Cl1ii | 0.90 | 2.29 | 3.1541 (18) | 162.1 |
O1—H1···Cl1iii | 0.86 (2) | 2.82 (4) | 3.492 (3) | 137 (5) |
C2—H2B···Cl1iv | 0.97 | 2.80 | 3.475 (2) | 127.7 |
Symmetry codes: (ii) x−1/2, y+1/2, z; (iii) x−1/2, y−1/2, z; (iv) −x+3/2, y+1/2, −z+3/2. |
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Hydrogen bonding plays an important role in the crystal engineering of organic solids (Desiraju, 1989; Melendez & Hamilton, 1998). There are many examples of one-, two- and three-dimentional objects formed by hydrogen bonds. The crystal structure of the title compound, (I), has already been reported by Rérat (1960), where a photographic method was used for the intensity measurement and an isotropic refinement of non-H atoms was applied. The refinement of low resultion (0.95 Å) and low quality of data resulted in a poor R value of 0.28 and no H atoms were located. We present here a redetermination of this structure using data from a Siemens SMART CCD diffractometer.
The atomic numbering for (I) is presented in Fig. 1. The structure exhibits hydrogen bonds of the type N—H···Cl, forming chains of hydrogen-bonded ions along the [110] and [110] directions (Fig. 2). The water molecules are on twofold axes and are located in the channels formed by crossed chains and they are invloved in weak hydrogen bonds of the O—H···Cl type with the nearest chains (Fig. 3). Thus, the water molecule shows high mobility which is reflected by high anisotropic displacement parameters of the O atom.