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The commercial imaging plate (IP) system, R-AXIS IV++ (RIGAKU Co., Japan) is an IP detector integrated with a read-out system. We evaluated it and made some improvements for R-AXIS IV++ to optimise it for the use of synchrotron X-ray solution scattering measurements. Rigorously controlling self-decay of stored images on the IP, a maximum 5% decrease in sensitivity was observed by changing the end time for IP erasure to the start time of exposure. By replacing standard IP material with another commercial material that gives a slower fading period, the decrease disappeared. It suggested that not only the self-decay of stored intensity, but also the relaxation of the IP was important in a quick measurement cycle (ca. 5 min). After these improvements were made, we compared its suitability for solution scattering with other detectors. We found scattering profiles amenable to quantitative analysis. However, in wide scattering regions with low signal strength, its dynamic range is still very sensitive to measuring conditions.

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