Characterization of heterogeneities in new-generation synthetic quartz crystals by small-angle X-ray scattering

Small-angle X-ray scattering was employed to investigate heterogeneities in growth sectors of a large Z-bar synthetic quartz. The measurements were performed in as-grown and heat-treated samples. As a result, X-ray scattering was observed in all samples. The Guinier approximation revealed a polydispersive distribution of heterogeneities in as-grown samples with a radius of gyration ranging from 80 to 250 Å. Infrared spectroscopy and X-ray fluorescence analysis were used to elucidate the nature of these heterogeneities. Considerable variations in the intensity of scattered X-rays due to heat treatments were only noticed in growth sectors with high OH-content. The results suggest that tiny aggregates of molecular water are the main reason for the scattering patterns observed in the range 0.006 < q < 0.1 Å^-1.