Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
To carry out small-angle scattering experiments with X-rays in the scattering vector range q < 10-3 Å-1 with area detectors, background must be carefuly reduced. The principal source of background is slit scattering. Careful polishing of slits allows slit diffraction to be observed, which can be calculated from wave equations. In this case, the background takes the shape of thin streaks perpendicular to the slit edges. This introduces the design of new beamstops, which are cross-shaped. Typical results obtained on the D2AM beamline of the ESRF are shown, especially for the case of coherent scattering.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds