Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
A Laue X-ray diffraction pattern indexing scheme, similar to a method previously proposed for convergent beam and backscattered electron diffraction patterns, was implemented. Experimental diffraction patterns are compared with simulated templates corresponding to crystals of prescribed orientations. The orientation of a diffracting volume is determined by maximizing a normalized cross correlation index between experimental and theoretical patterns. The advantages of template matching include (i) elimination of the requirement for extensive peak search/fitting analysis; (ii) the ability to index overlapped diffraction patterns obtained from neighboring grains or second phase particles; and (iii) the ability to confidently index patterns of low quality. A best fit orientation can then be determined by a least-squares fitting approach based on singular value decomposition. The misorientation within a diffracting volume is calculated from `smeared' and/or `split' Laue patterns. The methodologies developed are illustrated using micro-Laue diffraction data obtained from the wake of a fatigue crack.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
   HTML (US $40)
   PDF+HTML (US $50)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds