A focusing Laue diffractometer for the investigation of bulk crystals

A focusing Laue diffractometer for high-energy X-rays of up to 300 keV in a laboratory environment is presented. The long attenuation length for X-ray energies above 50 keV allows for the non-destructive investigation of structural issues and bulk properties of single crystals. Furthermore, massive sample environments such as high-temperature furnaces can be used more easily. With an area detector, anisotropic mosaicities or crystallite structure become visible without any rocking movement of the sample.