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Multiple Bragg reflections (MBRs), which can be realized in a bent perfect crystal (BPC) slab and are mutually in dispersive diffraction geometry, provide a monochromatic beam of excellent resolution. After identifying many MBR effects in a BPC Si crystal by using the method of θ–2θD scanning, we have turned our attention to the study of selected effects using the method of azimuthal rotation of the crystal lattice around the scattering vector of the primary reflection for a fixed chosen wavelength. In this paper, several azimuthal scans with the intention of possible practical exploitation for very high resolution diffractometry are presented.

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