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In the crystal structure of the title compound, C18H16O2, the mol­ecules related by a c-glide plane are linked into a column running along the c axis by a weak inter­molecular C—H...O hydrogen bond.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536807021253/is2156sup1.cif
Contains datablocks global, I

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536807021253/is2156Isup2.hkl
Contains datablock I

CCDC reference: 651482

Key indicators

  • Single-crystal X-ray study
  • T = 297 K
  • Mean [sigma](C-C) = 0.002 Å
  • R factor = 0.037
  • wR factor = 0.094
  • Data-to-parameter ratio = 14.0

checkCIF/PLATON results

No syntax errors found



Alert level C PLAT230_ALERT_2_C Hirshfeld Test Diff for C12 - C13 .. 5.08 su
0 ALERT level A = In general: serious problem 0 ALERT level B = Potentially serious problem 1 ALERT level C = Check and explain 0 ALERT level G = General alerts; check 0 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 1 ALERT type 2 Indicator that the structure model may be wrong or deficient 0 ALERT type 3 Indicator that the structure quality may be low 0 ALERT type 4 Improvement, methodology, query or suggestion 0 ALERT type 5 Informative message, check

Comment top

The title compound, (I), was synthesized because it was expected to have a big π conjugation system which is potentially useful in the photoelectric fields and the crystal engineering. The methoxy group attached to the benzene ring deviates slightly from the molecular plane with the torsion angle of C18—O2—C15—C16 = -0.59 (2)°. The related compound, 1-phenyl-5-phenylpenta-2,4-dien-1-one (Zhao et al., 1999), is more planar than its substituted derivatives (Vorontsova et al., 1973) and the present compound.

In the crystal structure, the molecules stack along the c axis through a very week C—H···O hydrogen bond (Table 1).

Related literature top

For related literature, see: Charles & Morris (1955); Vorontsova & Kazaryan (1973); Zhao et al. (1999).

Experimental top

The title compound was prepared according to the literature procedure of Charles & Morris (1955). The crude product was recrystallized several times from ethanol

and the yellow single crystals were obtained by slow evaporation of a ethanol solution (m.p. 369–371 K). Analysis calculated for C18H16O2: C 81.79, H 6.10%; found: C 81.60, H 5.99%.

Refinement top

All H atoms were positioned geometrically (C—H = 0.93 - 0.96 Å) and refined as riding, with Uiso(H) = 1.2Ueq(C) or 1.5Ueq(methyl C).

Structure description top

The title compound, (I), was synthesized because it was expected to have a big π conjugation system which is potentially useful in the photoelectric fields and the crystal engineering. The methoxy group attached to the benzene ring deviates slightly from the molecular plane with the torsion angle of C18—O2—C15—C16 = -0.59 (2)°. The related compound, 1-phenyl-5-phenylpenta-2,4-dien-1-one (Zhao et al., 1999), is more planar than its substituted derivatives (Vorontsova et al., 1973) and the present compound.

In the crystal structure, the molecules stack along the c axis through a very week C—H···O hydrogen bond (Table 1).

For related literature, see: Charles & Morris (1955); Vorontsova & Kazaryan (1973); Zhao et al. (1999).

Computing details top

Data collection: XSCANS (Siemens, 1994); cell refinement: XSCANS; data reduction: SHELXTL (Siemens, 1995); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: SHELXTL; software used to prepare material for publication: SHELXTL.

Figures top
[Figure 1] Fig. 1. The molecular structure of (I), showing the atom-labelling scheme. Displacement ellipsoids of non-H atoms are drawn at the 50% probability level.
1-(4-MMethoxyphenyl)-5-phenylpenta-2,4-dien-1-one top
Crystal data top
C18H16O2F(000) = 560
Mr = 264.31Dx = 1.209 Mg m3
Monoclinic, P21/cMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ybcCell parameters from 28 reflections
a = 12.004 (2) Åθ = 2.7–15.7°
b = 15.727 (2) ŵ = 0.08 mm1
c = 8.077 (1) ÅT = 297 K
β = 107.83 (1)°Block, yellow
V = 1451.6 (4) Å30.54 × 0.50 × 0.24 mm
Z = 4
Data collection top
Siemens P4
diffractometer
Rint = 0.014
Radiation source: normal-focus sealed tubeθmax = 25.0°, θmin = 1.8°
Graphite monochromatorh = 1413
ω scansk = 180
2974 measured reflectionsl = 09
2560 independent reflections3 standard reflections every 970 reflections
1439 reflections with I > 2σ(I) intensity decay: 2.2%
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.037H-atom parameters constrained
wR(F2) = 0.094 w = 1/[σ2(Fo2) + (0.0495P)2]
where P = (Fo2 + 2Fc2)/3
S = 0.87(Δ/σ)max = 0.001
2560 reflectionsΔρmax = 0.15 e Å3
183 parametersΔρmin = 0.14 e Å3
0 restraintsExtinction correction: SHELXL97 (Sheldrick, 1997), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.0139 (15)
Crystal data top
C18H16O2V = 1451.6 (4) Å3
Mr = 264.31Z = 4
Monoclinic, P21/cMo Kα radiation
a = 12.004 (2) ŵ = 0.08 mm1
b = 15.727 (2) ÅT = 297 K
c = 8.077 (1) Å0.54 × 0.50 × 0.24 mm
β = 107.83 (1)°
Data collection top
Siemens P4
diffractometer
Rint = 0.014
2974 measured reflections3 standard reflections every 970 reflections
2560 independent reflections intensity decay: 2.2%
1439 reflections with I > 2σ(I)
Refinement top
R[F2 > 2σ(F2)] = 0.0370 restraints
wR(F2) = 0.094H-atom parameters constrained
S = 0.87Δρmax = 0.15 e Å3
2560 reflectionsΔρmin = 0.14 e Å3
183 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
O10.19411 (9)0.10710 (7)0.09462 (16)0.0779 (4)
O20.73397 (9)0.17972 (7)0.04888 (15)0.0754 (4)
C10.09513 (15)0.47096 (11)0.1517 (2)0.0735 (5)
H10.01450.46760.20270.088*
C20.15599 (19)0.53658 (12)0.1957 (3)0.0891 (6)
H20.11630.57690.27650.107*
C30.2744 (2)0.54324 (14)0.1218 (3)0.0949 (7)
H30.31510.58790.15210.114*
C40.33271 (18)0.48377 (17)0.0028 (3)0.0975 (7)
H40.41310.48830.04910.117*
C50.27211 (16)0.41723 (13)0.0401 (2)0.0819 (6)
H50.31260.37660.11940.098*
C60.15188 (14)0.40975 (11)0.0328 (2)0.0616 (4)
C70.09118 (14)0.33810 (10)0.0168 (2)0.0655 (5)
H70.13800.29720.08840.079*
C80.02322 (13)0.32510 (10)0.0292 (2)0.0622 (4)
H80.07110.36610.09900.075*
C90.07948 (14)0.25328 (11)0.0195 (2)0.0619 (4)
H90.03220.21120.08640.074*
C100.19482 (13)0.24269 (11)0.0243 (2)0.0637 (4)
H100.24240.28390.09380.076*
C110.25122 (14)0.17021 (10)0.0299 (2)0.0588 (4)
C120.37840 (13)0.17344 (9)0.00920 (19)0.0529 (4)
C130.45110 (14)0.23974 (10)0.0734 (2)0.0643 (5)
H130.41970.28490.11880.077*
C140.56818 (14)0.23975 (11)0.0891 (2)0.0680 (5)
H140.61510.28470.14490.082*
C150.61673 (14)0.17356 (10)0.0229 (2)0.0583 (4)
C160.54681 (15)0.10737 (10)0.0613 (2)0.0620 (4)
H160.57860.06270.10750.074*
C170.42928 (14)0.10812 (10)0.0762 (2)0.0607 (4)
H170.38250.06330.13310.073*
C180.79246 (15)0.11007 (12)0.0003 (3)0.0913 (6)
H18A0.77790.05940.05660.110*
H18B0.87510.12110.03500.110*
H18C0.76390.10260.12350.110*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
O10.0749 (8)0.0590 (8)0.0965 (9)0.0060 (6)0.0216 (7)0.0063 (7)
O20.0646 (7)0.0727 (8)0.0924 (9)0.0057 (6)0.0294 (6)0.0050 (7)
C10.0682 (11)0.0671 (11)0.0934 (14)0.0034 (10)0.0368 (10)0.0038 (11)
C20.0998 (16)0.0662 (13)0.1164 (17)0.0003 (11)0.0553 (14)0.0053 (12)
C30.1090 (18)0.0872 (16)0.1075 (18)0.0339 (13)0.0611 (15)0.0227 (14)
C40.0766 (14)0.137 (2)0.0822 (15)0.0354 (14)0.0297 (12)0.0191 (15)
C50.0672 (12)0.1093 (16)0.0706 (12)0.0114 (11)0.0234 (10)0.0019 (11)
C60.0599 (11)0.0667 (11)0.0634 (11)0.0034 (9)0.0267 (9)0.0090 (9)
C70.0639 (11)0.0676 (11)0.0667 (11)0.0031 (9)0.0223 (9)0.0034 (9)
C80.0605 (11)0.0678 (11)0.0618 (11)0.0028 (9)0.0239 (9)0.0032 (9)
C90.0669 (11)0.0615 (10)0.0607 (10)0.0009 (9)0.0245 (8)0.0011 (9)
C100.0633 (11)0.0670 (11)0.0616 (11)0.0022 (9)0.0203 (8)0.0063 (9)
C110.0681 (11)0.0527 (11)0.0548 (10)0.0020 (9)0.0177 (8)0.0043 (8)
C120.0631 (10)0.0467 (9)0.0496 (9)0.0015 (8)0.0185 (8)0.0031 (8)
C130.0675 (11)0.0600 (11)0.0686 (11)0.0046 (9)0.0254 (9)0.0138 (9)
C140.0694 (11)0.0649 (11)0.0699 (12)0.0060 (9)0.0214 (9)0.0165 (9)
C150.0618 (11)0.0585 (11)0.0566 (10)0.0074 (9)0.0210 (8)0.0056 (8)
C160.0748 (11)0.0456 (9)0.0694 (11)0.0084 (8)0.0278 (9)0.0008 (8)
C170.0724 (11)0.0460 (9)0.0640 (11)0.0005 (8)0.0215 (9)0.0007 (8)
C180.0735 (12)0.0849 (14)0.1222 (17)0.0179 (11)0.0398 (12)0.0016 (12)
Geometric parameters (Å, º) top
O1—C111.2283 (17)C9—C101.3303 (19)
O2—C151.3613 (17)C9—H90.930
O2—C181.4196 (19)C10—C111.460 (2)
C1—C21.372 (2)C10—H100.930
C1—C61.383 (2)C11—C121.485 (2)
C1—H10.930C12—C171.387 (2)
C2—C31.367 (3)C12—C131.392 (2)
C2—H20.930C13—C141.372 (2)
C3—C41.370 (3)C13—H130.930
C3—H30.930C14—C151.379 (2)
C4—C51.378 (3)C14—H140.930
C4—H40.930C15—C161.379 (2)
C5—C61.387 (2)C16—C171.379 (2)
C5—H50.930C16—H160.930
C6—C71.463 (2)C17—H170.930
C7—C81.3242 (19)C18—H18A0.960
C7—H70.930C18—H18B0.960
C8—C91.432 (2)C18—H18C0.960
C8—H80.930
C15—O2—C18118.55 (13)O1—C11—C10120.58 (15)
C2—C1—C6121.00 (18)O1—C11—C12119.76 (14)
C2—C1—H1119.4C10—C11—C12119.65 (14)
C3—C2—C1120.6 (2)C17—C12—C13117.09 (14)
C3—C2—H2119.6C17—C12—C11119.41 (14)
C2—C3—C4119.6 (2)C13—C12—C11123.50 (14)
C2—C3—H3120.2C14—C13—C12121.25 (15)
C3—C4—C5119.9 (2)C14—C13—H13119.3
C3—C4—H4120.1C13—C14—C15120.44 (16)
C4—C5—C6121.2 (2)C13—C14—H14119.8
C4—C5—H5119.3O2—C15—C14115.23 (15)
C1—C6—C5117.59 (16)O2—C15—C16125.05 (14)
C1—C6—C7123.07 (15)C14—C15—C16119.72 (15)
C5—C6—C7119.34 (16)C15—C16—C17119.24 (15)
C8—C7—C6127.08 (16)C15—C16—H16120.4
C8—C7—H7116.5C16—C17—C12122.24 (15)
C7—C8—C9125.50 (16)C16—C17—H17119.0
C7—C8—H8117.3C15—O2—C18118.57 (14)
C10—C9—C8124.43 (16)H18A—C18—H18B109.5
C10—C9—H9117.8H18A—C18—H18C109.5
C9—C10—C11123.93 (16)H18B—C18—H18C109.5
C9—C10—H10118.0
C6—C1—C2—C30.4 (3)C10—C11—C12—C17173.78 (14)
C1—C2—C3—C40.0 (3)O1—C11—C12—C13175.43 (15)
C2—C3—C4—C50.8 (3)C10—C11—C12—C135.5 (2)
C3—C4—C5—C61.2 (3)C17—C12—C13—C140.7 (2)
C2—C1—C6—C50.0 (2)C11—C12—C13—C14179.97 (15)
C2—C1—C6—C7179.27 (16)C12—C13—C14—C150.0 (2)
C4—C5—C6—C10.8 (3)C18—O2—C15—C14173.68 (15)
C4—C5—C6—C7179.90 (16)C18—O2—C15—C165.9 (2)
C1—C6—C7—C86.5 (3)C13—C14—C15—O2178.89 (14)
C5—C6—C7—C8174.21 (16)C13—C14—C15—C160.7 (2)
C6—C7—C8—C9178.84 (14)O2—C15—C16—C17178.82 (14)
C7—C8—C9—C10178.09 (16)C14—C15—C16—C170.7 (2)
C8—C9—C10—C11178.35 (14)C15—C16—C17—C120.0 (2)
C9—C10—C11—O113.0 (2)C13—C12—C17—C160.6 (2)
C9—C10—C11—C12166.06 (15)C11—C12—C17—C16179.98 (14)
O1—C11—C12—C175.3 (2)
Hydrogen-bond geometry (Å, º) top
D—H···AD—HH···AD···AD—H···A
C8—H8···O1i0.932.503.280 (2)142
Symmetry code: (i) x, y+1/2, z+1/2.

Experimental details

Crystal data
Chemical formulaC18H16O2
Mr264.31
Crystal system, space groupMonoclinic, P21/c
Temperature (K)297
a, b, c (Å)12.004 (2), 15.727 (2), 8.077 (1)
β (°) 107.83 (1)
V3)1451.6 (4)
Z4
Radiation typeMo Kα
µ (mm1)0.08
Crystal size (mm)0.54 × 0.50 × 0.24
Data collection
DiffractometerSiemens P4
Absorption correction
No. of measured, independent and
observed [I > 2σ(I)] reflections
2974, 2560, 1439
Rint0.014
(sin θ/λ)max1)0.595
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.037, 0.094, 0.87
No. of reflections2560
No. of parameters183
H-atom treatmentH-atom parameters constrained
Δρmax, Δρmin (e Å3)0.15, 0.14

Computer programs: XSCANS (Siemens, 1994), XSCANS, SHELXTL (Siemens, 1995), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), SHELXTL.

Hydrogen-bond geometry (Å, º) top
D—H···AD—HH···AD···AD—H···A
C8—H8···O1i0.932.503.280 (2)142
Symmetry code: (i) x, y+1/2, z+1/2.
 

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