Determination of the dynamic deformation tensor by time-resolved triple-crystal diffractometry

Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized convex surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.