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In the mol­ecule of the title compound, C8H10IN, the I, N and methyl C atoms lie in the benzene ring plane. In the crystal structure, inter­molecular N—H...N hydrogen bonds may be effective in stabilizing the structure.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536807032151/hk2285sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536807032151/hk2285Isup2.hkl
Contains datablock I

CCDC reference: 657800

Key indicators

  • Single-crystal X-ray study
  • T = 298 K
  • Mean [sigma](C-C) = 0.016 Å
  • R factor = 0.050
  • wR factor = 0.144
  • Data-to-parameter ratio = 11.1

checkCIF/PLATON results

No syntax errors found



Alert level C PLAT342_ALERT_3_C Low Bond Precision on C-C Bonds (x 1000) Ang ... 16 PLAT420_ALERT_2_C D-H Without Acceptor N - H0B ... ? PLAT720_ALERT_4_C Number of Unusual/Non-Standard Label(s) ........ 2
Alert level G REFLT03_ALERT_4_G WARNING: Large fraction of Friedel related reflns may be needed to determine absolute structure From the CIF: _diffrn_reflns_theta_max 25.94 From the CIF: _reflns_number_total 1036 Count of symmetry unique reflns 1037 Completeness (_total/calc) 99.90% TEST3: Check Friedels for noncentro structure Estimate of Friedel pairs measured 0 Fraction of Friedel pairs measured 0.000 Are heavy atom types Z>Si present yes
0 ALERT level A = In general: serious problem 0 ALERT level B = Potentially serious problem 3 ALERT level C = Check and explain 1 ALERT level G = General alerts; check 0 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 1 ALERT type 2 Indicator that the structure model may be wrong or deficient 1 ALERT type 3 Indicator that the structure quality may be low 2 ALERT type 4 Improvement, methodology, query or suggestion 0 ALERT type 5 Informative message, check

Comment top

The title compound, (I), contains amino and halogen groups, in which they can react with different groups to prepare various functional organic compounds. It is a kind of aromatic organic intermediate that can be used for many fields such as aromatic conductive polymers, organometallic chemistry etc. (Zielinska & Skulski, 2005). We herein report its crystal structure.

In the molecule of (I), (Fig. 1), the bond lengths and angles (Table 1) are within normal ranges (Allen et al., 1987), which can be compared with the corresponding values in 2-iodo-N-(3-nitrobenzyl)aniline (Glidewell et al., 2002). The atoms I, N and methyl carbons lie in the benzene ring plane.

In the crystal structure, intermolecular N—H···N hydrogen bonds (Table 2) may be effective in the stabilization of the structure, the molecules are stacked along the a axis (Fig. 2).

Related literature top

For bond-length data, see: Allen et al. (1987). For related literature, see: Zielinska & Skulski (2005); Glidewell et al. (2002).

Experimental top

The title compound, (I) was prepared by the literature method (Zielinska & Skulski, 2005). The crystals were obtained by dissolving (I) (0.5 g) in hexane (20 ml) and evaporating the solvent slowly at room temperature for about 7 d.

Refinement top

H atoms were positioned geometrically, with N—H = 0.86 Å (for NH2) and C—H = 0.93 and 0.96 Å for aromatic and methyl H, respectively, and constrained to ride on their parent atoms, with Uiso(H) = xUeq(C,N), where x = 1.5 for methyl H, and x = 1.2 for all other H atoms.

Structure description top

The title compound, (I), contains amino and halogen groups, in which they can react with different groups to prepare various functional organic compounds. It is a kind of aromatic organic intermediate that can be used for many fields such as aromatic conductive polymers, organometallic chemistry etc. (Zielinska & Skulski, 2005). We herein report its crystal structure.

In the molecule of (I), (Fig. 1), the bond lengths and angles (Table 1) are within normal ranges (Allen et al., 1987), which can be compared with the corresponding values in 2-iodo-N-(3-nitrobenzyl)aniline (Glidewell et al., 2002). The atoms I, N and methyl carbons lie in the benzene ring plane.

In the crystal structure, intermolecular N—H···N hydrogen bonds (Table 2) may be effective in the stabilization of the structure, the molecules are stacked along the a axis (Fig. 2).

For bond-length data, see: Allen et al. (1987). For related literature, see: Zielinska & Skulski (2005); Glidewell et al. (2002).

Computing details top

Data collection: CAD-4 Software (Enraf-Nonius, 1985); cell refinement: CAD-4 Software; data reduction: XCAD4 (Harms & Wocadlo, 1995); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997a); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997a); molecular graphics: PLATON (Spek, 2003); software used to prepare material for publication: SHELXTL (Sheldrick, 1997b).

Figures top
[Figure 1] Fig. 1. The molecular structure of the title molecule, with the atom-numbering scheme. Displacement ellipsoids are drawn at the 50% probability level.
[Figure 2] Fig. 2. A packing diagram of (I). Hydrogen bonds are shown as dashed lines.
4-iodo-2,6-dimethylaniline top
Crystal data top
C8H10INDx = 1.846 Mg m3
Mr = 247.07Melting point: 324 K
Orthorhombic, P212121Mo Kα radiation, λ = 0.71073 Å
Hall symbol: P 2ac 2abCell parameters from 25 reflections
a = 4.841 (1) Åθ = 10–13°
b = 11.389 (2) ŵ = 3.53 mm1
c = 16.128 (3) ÅT = 298 K
V = 889.2 (3) Å3Needle, white
Z = 40.40 × 0.20 × 0.20 mm
F(000) = 472
Data collection top
Enraf-Nonius CAD-4
diffractometer
867 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.000
Graphite monochromatorθmax = 25.9°, θmin = 2.2°
ω/2θ scansh = 05
Absorption correction: ψ scan
(North et al., 1968)
k = 014
Tmin = 0.306, Tmax = 0.496l = 019
1036 measured reflections3 standard reflections every 120 min
1036 independent reflections intensity decay: 1%
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.050H-atom parameters constrained
wR(F2) = 0.144 w = 1/[σ2(Fo2) + (0.08P)2 + 4P]
where P = (Fo2 + 2Fc2)/3
S = 1.00(Δ/σ)max < 0.001
1036 reflectionsΔρmax = 0.62 e Å3
93 parametersΔρmin = 0.89 e Å3
0 restraintsAbsolute structure: Flack (1983), no Friedel pairs
Primary atom site location: structure-invariant direct methodsAbsolute structure parameter: 0.16 (13)
Crystal data top
C8H10INV = 889.2 (3) Å3
Mr = 247.07Z = 4
Orthorhombic, P212121Mo Kα radiation
a = 4.841 (1) ŵ = 3.53 mm1
b = 11.389 (2) ÅT = 298 K
c = 16.128 (3) Å0.40 × 0.20 × 0.20 mm
Data collection top
Enraf-Nonius CAD-4
diffractometer
867 reflections with I > 2σ(I)
Absorption correction: ψ scan
(North et al., 1968)
Rint = 0.000
Tmin = 0.306, Tmax = 0.4963 standard reflections every 120 min
1036 measured reflections intensity decay: 1%
1036 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.050H-atom parameters constrained
wR(F2) = 0.144Δρmax = 0.62 e Å3
S = 1.00Δρmin = 0.89 e Å3
1036 reflectionsAbsolute structure: Flack (1983), no Friedel pairs
93 parametersAbsolute structure parameter: 0.16 (13)
0 restraints
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
I0.9368 (2)0.13850 (9)0.90849 (5)0.0746 (4)
N1.380 (2)0.1794 (9)0.5450 (6)0.056 (3)
H0A1.49250.23440.53120.067*
H0B1.32010.13110.50810.067*
C10.982 (3)0.0018 (11)0.5800 (8)0.069 (4)
H1A0.91080.04300.53440.103*
H1B0.83810.04990.60270.103*
H1C1.13030.05100.56090.103*
C21.602 (3)0.3380 (10)0.6666 (8)0.054 (3)
H2A1.53460.38660.62240.081*
H2B1.77000.30020.64960.081*
H2C1.63720.38550.71460.081*
C31.385 (2)0.2443 (8)0.6879 (7)0.041 (2)
C41.286 (3)0.2360 (10)0.7675 (7)0.050 (3)
H4A1.35030.28740.80790.060*
C51.095 (3)0.1533 (9)0.7877 (6)0.045 (2)
C60.994 (2)0.0768 (11)0.7285 (7)0.056 (3)
H6A0.86150.02150.74290.067*
C71.092 (3)0.0824 (9)0.6476 (6)0.046 (3)
C81.293 (2)0.1686 (9)0.6277 (6)0.040 (2)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
I0.0877 (7)0.0859 (6)0.0504 (5)0.0028 (6)0.0114 (5)0.0090 (4)
N0.060 (7)0.058 (5)0.050 (5)0.000 (5)0.001 (5)0.012 (4)
C10.085 (11)0.051 (6)0.070 (8)0.018 (7)0.008 (8)0.007 (6)
C20.047 (7)0.048 (6)0.066 (7)0.017 (6)0.000 (6)0.007 (5)
C30.034 (6)0.039 (5)0.050 (5)0.007 (5)0.002 (5)0.004 (4)
C40.051 (7)0.045 (5)0.055 (6)0.006 (6)0.002 (6)0.004 (5)
C50.052 (7)0.041 (5)0.043 (5)0.003 (6)0.001 (5)0.002 (4)
C60.049 (8)0.057 (6)0.061 (7)0.005 (6)0.004 (6)0.013 (6)
C70.044 (6)0.043 (5)0.051 (6)0.012 (6)0.019 (6)0.002 (5)
C80.028 (5)0.047 (6)0.045 (5)0.002 (5)0.001 (4)0.004 (4)
Geometric parameters (Å, º) top
I—C52.101 (10)N—H0A0.8600
C1—C71.545 (16)N—H0B0.8600
C1—H1A0.9600C8—C31.372 (14)
C1—H1B0.9600C8—C71.421 (16)
C1—H1C0.9600C7—C61.389 (16)
C2—C31.537 (15)C6—C51.380 (17)
C2—H2A0.9600C6—H6A0.9300
C2—H2B0.9600C5—C41.359 (16)
C2—H2C0.9600C4—C31.373 (16)
N—C81.404 (14)C4—H4A0.9300
C7—C1—H1A109.5N—C8—C7118.7 (9)
C7—C1—H1B109.5C6—C7—C8118.4 (10)
H1A—C1—H1B109.5C6—C7—C1121.3 (11)
C7—C1—H1C109.5C8—C7—C1120.3 (10)
H1A—C1—H1C109.5C5—C6—C7120.1 (11)
H1B—C1—H1C109.5C5—C6—H6A120.0
C3—C2—H2A109.5C7—C6—H6A120.0
C3—C2—H2B109.5C4—C5—C6120.8 (10)
H2A—C2—H2B109.5C4—C5—I121.7 (8)
C3—C2—H2C109.5C6—C5—I117.5 (8)
H2A—C2—H2C109.5C5—C4—C3120.5 (11)
H2B—C2—H2C109.5C5—C4—H4A119.7
C8—N—H0A120.0C3—C4—H4A119.7
C8—N—H0B120.0C8—C3—C4120.4 (10)
H0A—N—H0B120.0C8—C3—C2120.0 (10)
C3—C8—N121.4 (10)C4—C3—C2119.6 (10)
C3—C8—C7119.8 (10)
C3—C8—C7—C60.6 (16)C6—C5—C4—C30.7 (18)
N—C8—C7—C6176.2 (10)I—C5—C4—C3179.5 (9)
C3—C8—C7—C1178.8 (11)N—C8—C3—C4176.5 (11)
N—C8—C7—C13.2 (16)C7—C8—C3—C41.1 (16)
C8—C7—C6—C50.5 (17)N—C8—C3—C24.4 (16)
C1—C7—C6—C5179.9 (11)C7—C8—C3—C2179.8 (10)
C7—C6—C5—C41.2 (18)C5—C4—C3—C80.5 (17)
C7—C6—C5—I180.0 (8)C5—C4—C3—C2179.5 (10)
Hydrogen-bond geometry (Å, º) top
D—H···AD—HH···AD···AD—H···A
N—H0A···Ni0.862.453.248 (12)155
Symmetry code: (i) x+1/2, y+1/2, z+1.

Experimental details

Crystal data
Chemical formulaC8H10IN
Mr247.07
Crystal system, space groupOrthorhombic, P212121
Temperature (K)298
a, b, c (Å)4.841 (1), 11.389 (2), 16.128 (3)
V3)889.2 (3)
Z4
Radiation typeMo Kα
µ (mm1)3.53
Crystal size (mm)0.40 × 0.20 × 0.20
Data collection
DiffractometerEnraf-Nonius CAD-4
Absorption correctionψ scan
(North et al., 1968)
Tmin, Tmax0.306, 0.496
No. of measured, independent and
observed [I > 2σ(I)] reflections
1036, 1036, 867
Rint0.000
(sin θ/λ)max1)0.615
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.050, 0.144, 1.00
No. of reflections1036
No. of parameters93
H-atom treatmentH-atom parameters constrained
Δρmax, Δρmin (e Å3)0.62, 0.89
Absolute structureFlack (1983), no Friedel pairs
Absolute structure parameter0.16 (13)

Computer programs: CAD-4 Software (Enraf-Nonius, 1985), CAD-4 Software, XCAD4 (Harms & Wocadlo, 1995), SHELXS97 (Sheldrick, 1997a), SHELXL97 (Sheldrick, 1997a), PLATON (Spek, 2003), SHELXTL (Sheldrick, 1997b).

Selected geometric parameters (Å, º) top
I—C52.101 (10)N—C81.404 (14)
C3—C8—N121.4 (10)C4—C5—I121.7 (8)
N—C8—C7118.7 (9)C6—C5—I117.5 (8)
Hydrogen-bond geometry (Å, º) top
D—H···AD—HH···AD···AD—H···A
N—H0A···Ni0.862.453.248 (12)155.3
Symmetry code: (i) x+1/2, y+1/2, z+1.
 

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