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X-ray diffraction experiments at very low temperatures require samples to be isolated from atmospheric conditions and held under vacuum. These conditions are usually maintained via the use of beryllium chambers, which also scatter X-rays, causing unwanted contamination of the sample's diffraction pattern. The removal of this contamination requires novel data-collection and processing procedures to be employed. Herein a new approach is described, which utilizes the differences in origin of scattering vectors from the sample and the beryllium to eliminate non-sample scattering. The program Masquerade has been written to remove contaminated regions of the diffraction data from the processing programs. Coupled with experiments at different detector distances, it allows for the acquisition of decontaminated data. Studies of several single crystals have shown that this approach increases data quality, highlighted by the improvement in internal agreement factor with the test case of cytidine presented herein.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0021889812000702/he5538sup1.cif
Contains datablocks global, cytidine_2k

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0021889812000702/he5538sup2.hkl
Contains datablock cytidine_2k

CCDC reference: 873872

Computing details top

Data collection: Apex II (Bruker, 2010); cell refinement: Apex II (Bruker, 2010); data reduction: SAINT (Bruker, 2009); program(s) used to solve structure: XS, G.M. Sheldrick, Acta Cryst. (2008). A64, 112-122; program(s) used to refine structure: XL, G.M. Sheldrick, Acta Cryst. (2008). A64, 112-122; molecular graphics: O. V. Dolomanov, L. J. Bourhis, R. J. Gildea, J. A. K. Howard and H. Puschmann, OLEX2: a complete structure solution, refinement and analysis program. J. Appl. Cryst. (2009). 42, 339-341.; software used to prepare material for publication: O. V. Dolomanov, L. J. Bourhis, R. J. Gildea, J. A. K. Howard and H. Puschmann, OLEX2: a complete structure solution, refinement and analysis program. J. Appl. Cryst. (2009). 42, 339-341..

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
[Figure 4]
(cytidine_2k) top
Crystal data top
C9H13N3O5F(000) = 512
Mr = 243.22Dx = 1.556 Mg m3
Orthorhombic, P212121Mo Kα radiation, λ = 0.71073 Å
a = 5.0784 (3) ŵ = 0.13 mm1
b = 13.9046 (10) ÅT = 2 K
c = 14.6992 (10) ÅNeedle, clear colourless
V = 1037.96 (12) Å30.26 × 0.05 × 0.05 mm
Z = 4
Data collection top
Bruker APEX-II CCD
diffractometer
2456 independent reflections
Radiation source: Bruker TXS with Helios Optics, Rotating Anode1916 reflections with I > 2σ(I)
Multilayer optics monochromatorRint = 0.052
Detector resolution: 8.3333 pixels mm-1θmax = 29.5°, θmin = 2.0°
φ scansh = 65
Absorption correction: multi-scan
SADABS2008/1 (Bruker,2008) was used for absorption correction. R(int) was 0.0761 before and 0.0570 after correction. The Ratio of minimum to maximum transmission is 0.8445. The λ/2 correction factor is 0.0015.
k = 1919
Tmin = 0.365, Tmax = 0.432l = 2020
9630 measured reflections
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.046H-atom parameters constrained
wR(F2) = 0.090 w = 1/[σ2(Fo2) + (0.0431P)2 + 0.0504P]
where P = (Fo2 + 2Fc2)/3
S = 1.03(Δ/σ)max < 0.001
2456 reflectionsΔρmax = 0.29 e Å3
157 parametersΔρmin = 0.24 e Å3
0 restraintsAbsolute structure: Not refined as all light-atom structure
Primary atom site location: structure-invariant direct methods
Crystal data top
C9H13N3O5V = 1037.96 (12) Å3
Mr = 243.22Z = 4
Orthorhombic, P212121Mo Kα radiation
a = 5.0784 (3) ŵ = 0.13 mm1
b = 13.9046 (10) ÅT = 2 K
c = 14.6992 (10) Å0.26 × 0.05 × 0.05 mm
Data collection top
Bruker APEX-II CCD
diffractometer
2456 independent reflections
Absorption correction: multi-scan
SADABS2008/1 (Bruker,2008) was used for absorption correction. R(int) was 0.0761 before and 0.0570 after correction. The Ratio of minimum to maximum transmission is 0.8445. The λ/2 correction factor is 0.0015.
1916 reflections with I > 2σ(I)
Tmin = 0.365, Tmax = 0.432Rint = 0.052
9630 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0460 restraints
wR(F2) = 0.090H-atom parameters constrained
S = 1.03Δρmax = 0.29 e Å3
2456 reflectionsΔρmin = 0.24 e Å3
157 parametersAbsolute structure: Not refined as all light-atom structure
Special details top

Experimental. Data were collected using φ scans of 0.5 degree width at 20 second exposures. Data were collected at 2 Kelvin, resulting in the Alert C in the CIF report.

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Completeness value resulting in Alert A is due to constraints on the experimental data collection parameters, the reduction in data completeness forms a significant result in the paper and is highlighted therein

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
O40.0496 (4)0.67555 (11)0.44839 (8)0.0117 (4)
H40.02390.65600.39500.018*
N10.1182 (4)0.46426 (12)0.67742 (10)0.0082 (4)
O50.1453 (3)0.41486 (10)0.42909 (9)0.0121 (4)
H50.04440.43050.38630.018*
N20.4615 (4)0.40068 (13)0.76938 (10)0.0093 (4)
O30.0475 (3)0.71677 (10)0.63188 (8)0.0109 (4)
H30.12030.74030.58570.016*
C50.0654 (5)0.54615 (15)0.66010 (12)0.0089 (5)
H5A0.13630.57080.71910.011*
O20.2749 (3)0.51363 (10)0.60459 (8)0.0091 (3)
N30.6470 (4)0.25597 (13)0.73486 (10)0.0123 (4)
H3A0.75330.26380.78160.015*
H3B0.65860.20380.70120.015*
O10.2930 (3)0.54968 (10)0.79465 (8)0.0103 (3)
C10.2956 (5)0.47393 (15)0.74938 (12)0.0095 (5)
C20.4694 (5)0.32267 (15)0.71530 (12)0.0100 (5)
C80.2618 (5)0.55944 (14)0.51559 (12)0.0088 (5)
H80.38760.61470.51410.011*
C90.3374 (5)0.48805 (15)0.44212 (12)0.0103 (5)
H9A0.50720.45770.45860.012*
H9B0.36300.52300.38410.012*
C70.0187 (5)0.59789 (15)0.51006 (12)0.0090 (5)
H70.14060.54450.49260.011*
C40.1191 (5)0.38328 (15)0.62465 (12)0.0103 (5)
H4A0.00350.37750.57610.012*
C30.2917 (5)0.31144 (15)0.64051 (12)0.0115 (5)
H3C0.29500.25550.60340.014*
C60.0735 (5)0.62804 (14)0.60846 (12)0.0093 (5)
H60.26670.62910.62160.011*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
O40.0160 (10)0.0124 (8)0.0067 (6)0.0011 (7)0.0004 (6)0.0010 (5)
N10.0072 (12)0.0076 (9)0.0098 (7)0.0009 (7)0.0004 (7)0.0014 (6)
O50.0141 (11)0.0108 (8)0.0115 (6)0.0008 (7)0.0036 (6)0.0003 (5)
N20.0098 (12)0.0095 (9)0.0085 (7)0.0001 (8)0.0004 (7)0.0002 (6)
O30.0142 (11)0.0089 (7)0.0094 (6)0.0031 (7)0.0015 (6)0.0003 (5)
C50.0068 (14)0.0105 (11)0.0094 (8)0.0003 (8)0.0006 (8)0.0006 (7)
O20.0072 (10)0.0120 (7)0.0082 (6)0.0013 (6)0.0004 (6)0.0023 (5)
N30.0165 (14)0.0100 (9)0.0105 (7)0.0026 (8)0.0007 (7)0.0008 (6)
O10.0116 (10)0.0099 (8)0.0095 (6)0.0004 (6)0.0012 (6)0.0017 (5)
C10.0085 (15)0.0126 (11)0.0074 (8)0.0015 (9)0.0033 (8)0.0023 (7)
C20.0100 (15)0.0100 (11)0.0100 (8)0.0044 (9)0.0021 (8)0.0037 (7)
C80.0095 (14)0.0090 (10)0.0078 (7)0.0005 (9)0.0008 (8)0.0019 (7)
C90.0103 (15)0.0121 (11)0.0086 (8)0.0008 (9)0.0011 (9)0.0001 (7)
C70.0119 (15)0.0075 (10)0.0076 (8)0.0001 (9)0.0010 (8)0.0008 (7)
C40.0100 (14)0.0126 (11)0.0082 (8)0.0029 (8)0.0005 (8)0.0004 (7)
C30.0157 (16)0.0094 (11)0.0096 (8)0.0023 (9)0.0010 (8)0.0007 (7)
C60.0105 (14)0.0089 (11)0.0084 (8)0.0010 (8)0.0001 (8)0.0015 (7)
Geometric parameters (Å, º) top
O4—C71.419 (2)C5—C61.540 (3)
N1—C51.493 (3)O2—C81.456 (2)
N1—C11.396 (3)N3—C21.325 (3)
N1—C41.367 (2)O1—C11.246 (2)
O5—C91.423 (3)C2—C31.431 (3)
N2—C11.354 (3)C8—C91.516 (3)
N2—C21.345 (3)C8—C71.524 (3)
O3—C61.421 (3)C7—C61.531 (2)
C5—O21.415 (3)C4—C31.349 (3)
C1—N1—C5117.29 (15)N3—C2—C3121.31 (19)
C4—N1—C5122.24 (17)O2—C8—C9110.00 (15)
C4—N1—C1120.46 (18)O2—C8—C7104.13 (16)
C2—N2—C1119.77 (18)C9—C8—C7115.36 (17)
N1—C5—C6111.22 (18)O5—C9—C8113.00 (19)
O2—C5—N1108.91 (16)O4—C7—C8113.87 (17)
O2—C5—C6107.25 (15)O4—C7—C6112.03 (16)
C5—O2—C8110.11 (15)C8—C7—C6102.46 (16)
N2—C1—N1119.59 (17)C3—C4—N1120.9 (2)
O1—C1—N1118.64 (18)C4—C3—C2117.49 (19)
O1—C1—N2121.76 (18)O3—C6—C5108.94 (18)
N2—C2—C3121.5 (2)O3—C6—C7112.82 (17)
N3—C2—N2117.15 (19)C7—C6—C5100.36 (16)

Experimental details

Crystal data
Chemical formulaC9H13N3O5
Mr243.22
Crystal system, space groupOrthorhombic, P212121
Temperature (K)2
a, b, c (Å)5.0784 (3), 13.9046 (10), 14.6992 (10)
V3)1037.96 (12)
Z4
Radiation typeMo Kα
µ (mm1)0.13
Crystal size (mm)0.26 × 0.05 × 0.05
Data collection
DiffractometerBruker APEX-II CCD
diffractometer
Absorption correctionMulti-scan
SADABS2008/1 (Bruker,2008) was used for absorption correction. R(int) was 0.0761 before and 0.0570 after correction. The Ratio of minimum to maximum transmission is 0.8445. The λ/2 correction factor is 0.0015.
Tmin, Tmax0.365, 0.432
No. of measured, independent and
observed [I > 2σ(I)] reflections
9630, 2456, 1916
Rint0.052
(sin θ/λ)max1)0.694
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.046, 0.090, 1.03
No. of reflections2456
No. of parameters157
H-atom treatmentH-atom parameters constrained
Δρmax, Δρmin (e Å3)0.29, 0.24
Absolute structureNot refined as all light-atom structure

Computer programs: Apex II (Bruker, 2010), SAINT (Bruker, 2009), XS, G.M. Sheldrick, Acta Cryst. (2008). A64, 112-122, XL, G.M. Sheldrick, Acta Cryst. (2008). A64, 112-122, O. V. Dolomanov, L. J. Bourhis, R. J. Gildea, J. A. K. Howard and H. Puschmann, OLEX2: a complete structure solution, refinement and analysis program. J. Appl. Cryst. (2009). 42, 339-341..

 

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