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X-ray powder diffraction experiments are performed to prove the possible crystallization of nitric acid dihydrate (HNO3·2H2O, further denoted NAD) and to determine the best thermal conditions for growing a single crystal. It is shown that the kinetic behaviour of NAD strongly depends on the preliminary thermal treatment. One good single crystal obtained by an in situ adapted Bridgman method procedure enabled determination of the crystal structure. The intensities of diffracted lines with h odd are all very weak. The H atom of nitric acid is delocalized to one water molecule leading to an association of equimolar nitrate (NO3-) and an H5O2+ ionic group. The asymmetric unit contains two such molecules. These two molecules are related by a pseudo a/2 translation (with a 0.3 Å mean atomic distance difference), except for one H atom of the water molecules (0.86 Å) because of their different orientations in the two molecules. The two molecules, linked by very strong hydrogen bonds, are arranged in layers. Two layers which are linked by weaker hydrogen bonds are approximately oriented along the c axis. The structure may be described by translations of this set of two layers along the c axis without hydrogen bonds leading to a two-dimensional hydrogen-bond network. The structures of the monohydrate (NAM) and trihydrate (NAT) are re-determined for comparisons. These structures may be described by one- and three-dimensional hydrogen-bond networks, respectively.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768100014506/gs0002sup1.cif
Contains datablocks global, I

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768100014506/gs0002sup2.hkl
Contains datablock shelxl

Computing details top

Data collection: Philips PW1100 software; cell refinement: Philips PW1100 software; data reduction: Philips PW1100 software; program(s) used to solve structure: SHELXS86 (Sheldrix, 1990); program(s) used to refine structure: SHELXL93 (Sheldrick, 1993); molecular graphics: ORTEP-III (Burnett and Johnson, 1996).

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
[Figure 4]
[Figure 5]
[Figure 6]
[Figure 7]
[Figure 8]
(I) top
Crystal data top
HNO3·2(H2O)F(000) = 416
Mr = 99.04Dx = 1.654 Mg m3
Monoclinic, P21/nMo Kα radiation, λ = 0.71069 Å
a = 17.509 (3) ÅCell parameters from 25 reflections
b = 7.619 (4) Åθ = 5.5–25°
c = 6.253 (3) ŵ = 0.19 mm1
β = 107.5 (3)°T = 200 K
V = 796 (2) Å3Cylindrical, colourless
Z = 80.5 mm (radius)
Data collection top
Philips PW1100
diffractometer
Rint = 0.042
Radiation source: fine-focus sealed tubeθmax = 26.0°, θmin = 2.4°
Graphite monochromatorh = 2120
ω–2θ scansk = 99
3665 measured reflectionsl = 37
1567 independent reflections3 standard reflections every 60 min
1315 reflections with > σ(I) intensity decay: 1%
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.032Only H-atom displacement parameters refined
wR(F2) = 0.092 w = 1/[σ2(Fo2) + (0.0375P)2], P = (Fo2 + 2Fc2)/3
S = 1.34(Δ/σ)max = 0.003
1567 reflectionsΔρmax = 0.3 e Å3
150 parametersΔρmin = 0.2 e Å3
0 restraintsExtinction correction: SHELXL, Fc*=kFc[1+0.001xFc2l3/sin(2q)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.040 (4)
Crystal data top
HNO3·2(H2O)V = 796 (2) Å3
Mr = 99.04Z = 8
Monoclinic, P21/nMo Kα radiation
a = 17.509 (3) ŵ = 0.19 mm1
b = 7.619 (4) ÅT = 200 K
c = 6.253 (3) Å0.5 mm (radius)
β = 107.5 (3)°
Data collection top
Philips PW1100
diffractometer
Rint = 0.042
3665 measured reflections3 standard reflections every 60 min
1567 independent reflections intensity decay: 1%
1315 reflections with > σ(I)
Refinement top
R[F2 > 2σ(F2)] = 0.0320 restraints
wR(F2) = 0.092Only H-atom displacement parameters refined
S = 1.34Δρmax = 0.3 e Å3
1567 reflectionsΔρmin = 0.2 e Å3
150 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement on F2 for ALL reflections except for 0 with very negative F2 or flagged by the user for potential systematic errors. Weighted R-factors wR and all goodnesses of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The observed criterion of F2 > σ(F2) is used only for calculating the R factor etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
NA0.10177 (7)0.14924 (18)0.8655 (2)0.0251 (3)
O1A0.04054 (6)0.04734 (14)0.8034 (2)0.0321 (3)
O2A0.09168 (6)0.30802 (15)0.8536 (2)0.0346 (3)
O3A0.16836 (6)0.07946 (16)0.9337 (2)0.0387 (3)
NB0.38750 (7)0.15648 (18)1.1057 (2)0.0244 (3)
O1B0.44779 (6)0.05405 (14)1.1747 (2)0.0332 (3)
O2B0.39614 (7)0.31434 (14)1.1393 (2)0.0347 (3)
O3B0.32115 (6)0.08980 (15)1.0037 (2)0.0328 (3)
O4A0.07134 (7)0.27208 (16)0.9186 (2)0.0260 (3)
H1A0.0632 (15)0.143 (4)0.884 (5)0.086 (9)*
H2A0.1196 (14)0.309 (3)0.902 (4)0.054 (6)*
H3A0.0366 (13)0.338 (3)0.847 (4)0.054 (7)*
O4B0.41388 (7)0.27453 (16)1.0743 (2)0.0271 (3)
H1B0.4267 (14)0.158 (4)1.102 (4)0.066 (8)*
H2B0.3660 (15)0.300 (3)1.095 (4)0.067 (7)*
H3B0.4497 (13)0.345 (3)1.150 (4)0.047 (6)*
O5A0.20905 (6)0.36788 (17)0.8978 (2)0.0305 (3)
H4A0.2401 (16)0.275 (3)0.914 (5)0.065 (7)*
H5A0.2093 (15)0.419 (3)0.780 (5)0.077 (9)*
O5B0.28264 (7)0.32933 (18)1.1298 (2)0.0351 (4)
H4B0.2453 (18)0.238 (4)1.044 (5)0.101 (10)*
H5B0.2622 (13)0.419 (3)1.085 (4)0.057 (8)*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
NA0.0201 (5)0.0215 (7)0.0331 (7)0.0002 (5)0.0070 (5)0.0024 (6)
O1A0.0192 (5)0.0210 (5)0.0522 (8)0.0019 (4)0.0045 (5)0.0013 (6)
O2A0.0314 (6)0.0190 (6)0.0517 (8)0.0006 (5)0.0097 (5)0.0022 (6)
O3A0.0188 (5)0.0327 (7)0.0593 (9)0.0036 (5)0.0039 (5)0.0031 (7)
NB0.0201 (6)0.0217 (6)0.0315 (7)0.0015 (5)0.0081 (5)0.0021 (6)
O1B0.0208 (5)0.0198 (6)0.0538 (8)0.0021 (4)0.0031 (5)0.0002 (6)
O2B0.0325 (6)0.0168 (5)0.0493 (8)0.0006 (5)0.0041 (5)0.0034 (6)
O3B0.0188 (5)0.0296 (7)0.0478 (7)0.0045 (4)0.0067 (5)0.0084 (6)
O4A0.0204 (6)0.0228 (6)0.0324 (7)0.0012 (5)0.0041 (5)0.0012 (5)
O4B0.0249 (6)0.0210 (6)0.0323 (7)0.0028 (5)0.0040 (5)0.0003 (5)
O5A0.0232 (5)0.0263 (6)0.0389 (7)0.0008 (5)0.0045 (5)0.0024 (6)
O5B0.0248 (6)0.0311 (7)0.0460 (8)0.0009 (5)0.0054 (5)0.0021 (7)
Geometric parameters (Å, º) top
NA—O1A1.286 (2)NB—O1B1.279 (2)
NA—O2A1.222 (2)NB—O2B1.223 (2)
NA—O3A1.235 (2)NB—O3B1.253 (2)
O4A—H1A0.99 (3)O4B—H1B0.92 (3)
O4A—H2A0.93 (2)O4B—H2B0.91 (3)
O4A—H3A0.81 (3)O4B—H3B0.85 (2)
O5A—H4A0.88 (3)O5B—H4B0.99 (3)
O5A—H5A0.83 (3)O5B—H5B0.78 (2)
O2A—NA—O3A123.5 (1)H3A—O4A—H1A117 (2)
O2A—NA—O1A119.2 (1)H2A—O4A—H1A111 (2)
O3A—NA—O1A117.4 (1)H3B—O4B—H2B110 (2)
O2B—NB—O3B122.3 (1)H3B—O4B—H1B114 (2)
O2B—NB—O1B119.7 (1)H2B—O4B—H1B111 (2)
O3B—NB—O1B118.0 (1)H4A—O5A—H5A108 (3)
H3A—O4A—H2A108 (2)H5B—O5B—H4B105 (2)

Experimental details

Crystal data
Chemical formulaHNO3·2(H2O)
Mr99.04
Crystal system, space groupMonoclinic, P21/n
Temperature (K)200
a, b, c (Å)17.509 (3), 7.619 (4), 6.253 (3)
β (°) 107.5 (3)
V3)796 (2)
Z8
Radiation typeMo Kα
µ (mm1)0.19
Crystal size (mm)0.5 (radius)
Data collection
DiffractometerPhilips PW1100
diffractometer
Absorption correction
No. of measured, independent and
observed [ > σ(I)] reflections
3665, 1567, 1315
Rint0.042
(sin θ/λ)max1)0.617
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.032, 0.092, 1.34
No. of reflections1567
No. of parameters150
H-atom treatmentOnly H-atom displacement parameters refined
Δρmax, Δρmin (e Å3)0.3, 0.2

Computer programs: Philips PW1100 software, SHELXS86 (Sheldrix, 1990), SHELXL93 (Sheldrick, 1993), ORTEP-III (Burnett and Johnson, 1996).

 

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