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short communications
An X-ray method is presented to characterize thin films with unknown crystal structure with specific crystal orientations. The method maps large volumes of the reciprocal space by a series of pole-figure measurements using a standard texture goniometer. The data can be used for lattice indexing and texture evaluation and in subsequent steps for a complete structural thin-film characterization. The application of the method is demonstrated on an organic monodomain thin film consisting of uniaxially aligned crystallites.