Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
New algorithms have been devised and implemented in the program SIR2007 for the deconvolution of Patterson maps via the use of implication transformations and of the minimum superposition function. The new algorithms concern several practical aspects, such as the use of weighted Patterson syntheses to simplify the recognition of useful pivot peaks, the definition of a ranking criterion for them, the introduction of an early figure of merit to discard useless pivots and the fast Fourier transform transposition of the RELAX algorithm, aiming to find the correct location when the current molecular model is translated with respect to the true position. The advantages of the new procedure have been assessed using a large set of test structures. The results have been analysed with respect to four parameters: the CPU time necessary for obtaining and recognizing the correct solution, the presence of heavy atoms, the complexity limit of the structures solvable ab initio, and the data resolution limit.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
   HTML (US $40)
   PDF+HTML (US $50)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds