Two methods of expanding the measurement abilities of a four-circle diffractometer

The measuring routines of a conventional four-circle diffractometer (Stoe) have been modified to allow various scan types in a fully automatic mode. Scan parameters may be entered either as angular (2θ, ω, χ, φ) or as hkl values and are given by two ASCII input files. A set of scans in up to four dimensions may be performed. Scans performed with hkl values are based on the orientation matrix of the single-crystal or the matrix of the substrate for the investigations of partially crystallized thin films. The relative orientations of thin films and substrates can be determined.