Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
Anomalous small-angle X-ray scattering (ASAXS) was employed to analyze CdSxSe1 - x-doped silicate glasses, x = 0.4 and 0.6. From the intensity variations, as measured for four X-ray energies near the K-absorption edge of Se and at 9.5 keV, reliable values for the ratio of molecular densities in the crystalline CdSxSe1 - x phase and the surrounding amorphous matrix were found. Combination of this with the integrated intensity yields values for the CdSxSe1 - x volume fraction of 0.7 to 3%. Mean particle radii between 5 and 7 nm and number densities in the range 1 to 8 × 1016 cm-3 were obtained from fitted Gaussian and log-normal size distributions, respectively.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds