Thin-Film Study using Low-Incidence and Bragg-Brentano Texture Goniometry. Application to Mono- and Bilayers of Al and Al/Fe

Texture goniometry of thin layers needs intensity corrections in Bragg-Brentano or low-incidence geometries. These intensity corrections are described for the case where the diffracting volume consists of a single layer or bilayers. As an application, the respective orientations of aluminium thin films deposited on steel and bilayers of aluminium/iron deposited on silicon wafers are studied. The orientation relationship between iron and silicon is (111)_Si||(110)_Fe and between aluminium and iron is (111)_Al||(110_Fe) with [011]_Al||[100]_Fe.