Twinning study of CdTe epitaxic layer by X-ray ι-scan measurement

A new application of an X-ray φ-scan setup is presented. The φ motion has been installed on an X-ray powder diffractometer. The application of this system to twinned crystals is described. The X-ray φ-scan diffraction pattern can show twins in the crystal studies to a very good precision. The ratio between the twin diffraction peaks and those from the crystal matrix gives the twin yield. This method is a great deal faster and more precise than the previous one used to study twins, which consisted of recording successively the various diffraction peaks of a chosen plane on a simple diffraction setup.