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XRDA, an analysis software for energy-dispersive X-ray diffraction data obtained from samples compressed in a diamond-anvil cell using synchrotron radiation, is described. The code takes advantage of the recent availability of inexpensive fast PC's and the widespread Windows graphical environment. The program offers an efficient way to analyze the numerous diffraction patterns usually recorded as a function of pressure. In addition to X-ray data file management, peak profile fitting and diffraction intensity calculations, crystalline structure determinations can easily be performed.

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