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A multiple slit for simultaneously recording up to ten section topographs is described for use with synchrotron white radiation. Two collimators were fabricated from a GaAs crystal and a Ta sheet by laser machining; the spacing was 1 mm between each of the ten parallel 50 μm × 10 mm slits. The longest dimension of the slits was in the horizontal plane, and rotations of the multiple slit between 20 and 25° from normal to the incident beam (i.e. about an axis parallel to slits) produced the sharpest Pendellösung fringe patterns from a dislocation-free Si crystal. The Ta multiple slit proved to be much superior to the GaAs slits, but background levels were somewhat higher than for single slits.

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