Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
The design, development and performance of the time-of-flight (TOF) small-angle diffractometer (SAD) at the Intense Pulsed Neutron Source (IPNS) at Argonne National Laboratory are described. Similar TOF-SANS instruments are in operation at the pulsed neutron sources at Los Alamos National Laboratory, USA, at Rutherford Appleton Laboratory, England, and at KEK, Japan. These instruments have an advantage by comparison with their steady-state counterparts in that a relatively wide range of momentum transfer (q) can be monitored in a single experiment without the need to alter the collimation or the sample-to-detector distance. This feature makes SANS experiments easy and very effective for studying systems such as those undergoing phase transitions under different conditions, samples that cannot be easily reproduced for repetitive experiments, and systems under high temperature, pressure or shear. Three standard samples are used to demonstrate that the quality of the SANS data from SAD is comparable with those from other established steady-state SANS facilities. Two examples are given to illustrate that the wide q region accessible in a single measurement at SAD is very effective for following the time-dependent phase transitions in paraffins and temperature- and pressure-dependent phase transitions in model biomembranes.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds