Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
Stress analysis by X-ray diffraction, usually performed on a specimen with plane geometry, becomes very difficult on more complex surfaces. A model is proposed to calculate the six independent components of the stress tensor for cylindrical symmetry. The mathematical approach described highlights two distinct effects that modify values of measured strain by X-ray diffraction, a rotation effect and a translation effect. The X-ray absorption by the material is taken into consideration and two models are proposed to undertake the mathematical processing on thick materials and thin layers. It is equally possible to take into account, for example, crystallographic texture and experimental features as φψ oscillations., Examples and applications will be given in paper II [Dionnet, François, Sprauel & Nardou (1995). In preparation].

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds