Phase analysis of bulk samples using sample-tilting X-ray diffractometry

In the Bragg-Brentano X-ray powder diffractometer, the sample-tilting X-ray diffraction (STD) technique probes a fixed depth of penetration from the sample surface. In this way, phase analysis can be carried out from the surface layers to the depth probed by the CBD (conventional Bragg-Brentano geometry X-ray diffraction) method. In the present paper, after derivation of the diffracted intensity and the observed crystal-plane azimuthal equations, attention is focused on investigations of the geometrical optics of X-ray surface reflection by comparing the STD and CBD methods. Some examples are given to illustrate the applications of the STD technique for solving phase analyses and related problems.